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50 GHz Multiplexer and Demultiplexer Designs with On-Chip Testing

Lizhen ZHENG, Xiaofan MENG, Stephen WHITELEY, Theodore Van DUZER

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Summary :

We present the design of dual rail Data Driven Self Timed (DDST) DEMUX and MUX circuits for 50 GHz operation. The chosen current density is 6.5 kA/cm2 and simulations show good margins for speeds exceeding 50 GHz. Our previously reported dual-rail on-chip test system is also scaled up for 50 GHz operation.

Publication
IEICE TRANSACTIONS on Electronics Vol.E85-C No.3 pp.621-624
Publication Date
2002/03/01
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section PAPER (Special Issue on Superconductive Electronics)
Category
Digital Devices and Their Applications

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