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Local Area Characterization of Evaporated TTF-TCNQ Complex Films with Scanning Tunneling Spectroscopy

Masakazu NAKAMURA, Masaaki IIZUKA, Kazuhiro KUDO, Kuniaki TANAKA

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Summary :

STM/STS measurements have been carried out for TTF-TCNQ complex films evaporated on hydrogen-terminated silicon substrates, and the variation of tunneling spectra has been investigated on morphologically different crystal grains. Very thin semiconductive adsorbed layers were found to cover the as-deposited film surfaces. By removing the adsorbed layers, the intrinsic electronic structures of two different phases were revealed. A 'needle phase' which appears at the early stage of film growth has a semiconductive character and a 'granular phase' which grows later has a metallic character similar to bulk crystals. The electronic structure of the needle phase is considered to be affected by the substrate although the crystallographic structure is similar to the bulk crystal of TTF-TCNQ.

Publication
IEICE TRANSACTIONS on Electronics Vol.E85-C No.6 pp.1323-1327
Publication Date
2002/06/01
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section PAPER (Special Issue on Recent Progress in Organic Molecular Electronics)
Category
Fabrication and Characterization of Thin Films

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