This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either 1s or 0s) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = 「 log 2N 」 + 2. In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.
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Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, "A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss" in IEICE TRANSACTIONS on Fundamentals,
vol. E91-A, no. 12, pp. 3514-3523, December 2008, doi: 10.1093/ietfec/e91-a.12.3514.
Abstract: This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either 1s or 0s) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = 「 log 2N 」 + 2. In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e91-a.12.3514/_p
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@ARTICLE{e91-a_12_3514,
author={Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss},
year={2008},
volume={E91-A},
number={12},
pages={3514-3523},
abstract={This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either 1s or 0s) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = 「 log 2N 」 + 2. In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.},
keywords={},
doi={10.1093/ietfec/e91-a.12.3514},
ISSN={1745-1337},
month={December},}
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TY - JOUR
TI - A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3514
EP - 3523
AU - Youhua SHI
AU - Nozomu TOGAWA
AU - Masao YANAGISAWA
AU - Tatsuo OHTSUKI
PY - 2008
DO - 10.1093/ietfec/e91-a.12.3514
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E91-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2008
AB - This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either 1s or 0s) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = 「 log 2N 」 + 2. In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.
ER -