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OTA-C Based BIST Structure for Analog Circuits

Cheng-Chung HSU, Wu-Shiung FENG

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Summary :

In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E83-A No.4 pp.771-773
Publication Date
2000/04/25
Publicized
Online ISSN
DOI
Type of Manuscript
LETTER
Category
VLSI Design Technology and CAD

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