In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
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Cheng-Chung HSU, Wu-Shiung FENG, "OTA-C Based BIST Structure for Analog Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E83-A, no. 4, pp. 771-773, April 2000, doi: .
Abstract: In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e83-a_4_771/_p
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@ARTICLE{e83-a_4_771,
author={Cheng-Chung HSU, Wu-Shiung FENG, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={OTA-C Based BIST Structure for Analog Circuits},
year={2000},
volume={E83-A},
number={4},
pages={771-773},
abstract={In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.},
keywords={},
doi={},
ISSN={},
month={April},}
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TY - JOUR
TI - OTA-C Based BIST Structure for Analog Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 771
EP - 773
AU - Cheng-Chung HSU
AU - Wu-Shiung FENG
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E83-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2000
AB - In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
ER -