Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.
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Geng HU, Hong WANG, Shiyuan YANG, "Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits" in IEICE TRANSACTIONS on Information,
vol. E91-D, no. 8, pp. 2134-2140, August 2008, doi: 10.1093/ietisy/e91-d.8.2134.
Abstract: Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e91-d.8.2134/_p
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@ARTICLE{e91-d_8_2134,
author={Geng HU, Hong WANG, Shiyuan YANG, },
journal={IEICE TRANSACTIONS on Information},
title={Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits},
year={2008},
volume={E91-D},
number={8},
pages={2134-2140},
abstract={Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.},
keywords={},
doi={10.1093/ietisy/e91-d.8.2134},
ISSN={1745-1361},
month={August},}
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TY - JOUR
TI - Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
T2 - IEICE TRANSACTIONS on Information
SP - 2134
EP - 2140
AU - Geng HU
AU - Hong WANG
AU - Shiyuan YANG
PY - 2008
DO - 10.1093/ietisy/e91-d.8.2134
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E91-D
IS - 8
JA - IEICE TRANSACTIONS on Information
Y1 - August 2008
AB - Testing is a critical stage in integrated circuits production in order to guarantee reliability. The complexity and high integration level of mixed-signal ICs has put forward new challenges to circuit testing. This paper describes an oscillation-based combined self-test strategy for the analog portion and analog-to-digital converters (ADCs) in integrated mixed-signal circuits. In test mode, the analog portion under test is reconfigured into an oscillator, generating periodic signals as the test stimulus of ADC. By analyzing the A/D conversion results, a histogram test of ADC can be performed, and the oscillation frequency as well as amplitude can be checked, and in this way the oscillation test of the analog portion is realized simultaneously. For an analog benchmark circuit combined with an ADC, triangle oscillation and sinusoid oscillation schemes are both given to test their faults. Experimental results show that fault coverage of the analog portion is 92.2% and 94.3% in the two schemes respectively, and faults in the ADC can also be tested.
ER -