This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.
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Yongjoon KIM, Myung-Hoon YANG, Jaeseok PARK, Eunsei PARK, Sungho KANG, "Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time" in IEICE TRANSACTIONS on Information,
vol. E92-D, no. 7, pp. 1462-1465, July 2009, doi: 10.1587/transinf.E92.D.1462.
Abstract: This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E92.D.1462/_p
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@ARTICLE{e92-d_7_1462,
author={Yongjoon KIM, Myung-Hoon YANG, Jaeseok PARK, Eunsei PARK, Sungho KANG, },
journal={IEICE TRANSACTIONS on Information},
title={Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time},
year={2009},
volume={E92-D},
number={7},
pages={1462-1465},
abstract={This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.},
keywords={},
doi={10.1587/transinf.E92.D.1462},
ISSN={1745-1361},
month={July},}
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TY - JOUR
TI - Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
T2 - IEICE TRANSACTIONS on Information
SP - 1462
EP - 1465
AU - Yongjoon KIM
AU - Myung-Hoon YANG
AU - Jaeseok PARK
AU - Eunsei PARK
AU - Sungho KANG
PY - 2009
DO - 10.1587/transinf.E92.D.1462
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E92-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 2009
AB - This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.
ER -