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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

Yongjoon KIM, Myung-Hoon YANG, Jaeseok PARK, Eunsei PARK, Sungho KANG

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Summary :

This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

Publication
IEICE TRANSACTIONS on Information Vol.E92-D No.7 pp.1462-1465
Publication Date
2009/07/01
Publicized
Online ISSN
1745-1361
DOI
10.1587/transinf.E92.D.1462
Type of Manuscript
LETTER
Category
VLSI Systems

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