Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.
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Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA, "A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 1, pp. 24-32, January 2010, doi: 10.1587/transinf.E93.D.24.
Abstract: Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.24/_p
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@ARTICLE{e93-d_1_24,
author={Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA, },
journal={IEICE TRANSACTIONS on Information},
title={A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint},
year={2010},
volume={E93-D},
number={1},
pages={24-32},
abstract={Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.},
keywords={},
doi={10.1587/transinf.E93.D.24},
ISSN={1745-1361},
month={January},}
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TY - JOUR
TI - A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
T2 - IEICE TRANSACTIONS on Information
SP - 24
EP - 32
AU - Ryoichi INOUE
AU - Toshinori HOSOKAWA
AU - Hideo FUJIWARA
PY - 2010
DO - 10.1587/transinf.E93.D.24
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 1
JA - IEICE TRANSACTIONS on Information
Y1 - January 2010
AB - Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.
ER -