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[Author] Atsumu ISENO(1hit)

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  • Fault Diagnosis for RAMs Using Walsh Spectrum

    Atsumu ISENO  Yukihiro IGUCHI  Tsutomu SASAO  

     
    PAPER-Memory Testing

      Vol:
    E87-D No:3
      Page(s):
    592-600

    In this paper, we show a method to locate a single stuck-at fault of a random access memory (RAM). From the fail-bitmaps of the RAM, we obtain their Walsh spectrum. For a single stuck-at fault, we show that the fault can be identified and located by using only the 0-th and 1-st coefficients of the spectrum. We also show a circuit to compute these coefficients. The computation time is O(2n), where n is the number of bits in the address of the RAM. The computation time is much shorter than one that uses a logic minimization method.