This paper presents a new type of optical probe designed to detect magnetic near-fields with high accuracy in the gigahertz range. Its probe head consists of a loop antenna element doubly loaded with LiNbO3 electro-optic crystals. Through an optical technique, it can work as a conventional double-loaded loop probe without metallic cables or an electrical hybrid junction. We examined probe characteristics for magnetic field detection up to 20 GHz. We confirmed that the probe can measure magnetic fields near a microstrip line in the gigahertz range and can suppress influence of electric fields.

An optically scanning electromagnetic field probe system consisting of an electro-optic or magneto-optic crystal and a galvano scanner is proposed for high-speed electromagnetic field distribution measurements. We used this technique to measure electromagnetic field distributions near printed circuit boards or ICs to address electromagnetic compatibility problems or in designing electronic devices. With our scanning system, we can measure the electric field intensities of about 40,000 points with an area of 4040 mm in about 3 minutes (4 ms per point) up to 2.7 GHz. We measured the electric near-field distribution above a five-split transmission line using a cadmium telluride (CdTe) electro-optic crystal. The measurement results showed that the spatial resolution of the system was less than 400 µm in the case of a common current with a crystal thickness of 1 mm. The electric near-field distribution above a microstrip line filter was measured using LiNbO3 electro-optic crystal. Changes in the distribution according to the frequency were observed. The experimental results obtained using this system were compared with simulation results obtained using a finite-difference time-domain method. The overall results indicated that the measurement system is capable of accurately measuring electric near-fields. We also discuss the invasiveness of the measurement system, due to the electro-optic crystals, in terms of both the experimental and simulated results.

A magnetic field probe consisting of a LiNbO3 optical waveguide modulator and a loop antenna element was developed to enable accurate measurement of magnetic near-fields in the gigahertz range. The invasiveness of the probe was assessed by using it to measure the magnetic field distribution above a patch antenna operating at 2.49 GHz. The measurements were compared with those obtained using a shielded loop probe. The experimental results obtained using the probe were also compared with simulation results obtained using a finite-difference time-domain (FDTD) method. The overall results indicated that the optical waveguide probe was capable of accurately measuring magnetic near-fields with low disturbance of the measured fields.

Electromagnetic field probes inevitably disturb the original distribution of the field when they are positioned close to a device. This disturbance in turn affects measurement accuracy and device operation. We developed an optical magnetic field probe, comprising a loop antenna element and an electro-optic crystal, for highly accurate magnetic near-field measurement in the GHz frequency range. We analyzed the invasiveness of the optical magnetic field probe quantitatively both experimentally and using finite difference time domain simulation. We found that eliminating the metal cable reduced the disturbance of the surrounding field that was to be measured. In addition, we investigated the magnetic field detection characteristics of the probe and its influence on the operation of a microstrip line. The optical magnetic field probe was less invasive and provided more accurate measurement.