The origin of and a method of enhancing the Optical Beam Induced Resistance Change (OBIRCH) signal for defect observation in VLSI metal interconnections is discussed based on a numerical analysis of three-dimensional thermal conduction and experimental results. The numerical analysis shows that the OBIRCH signal originates from a slight increase in the resistance of the metal line caused by laser beam heating and that its effect is influenced by the temperature of the metal layer. Both simulations and experimental results suggest that cooling the sample is preferable to detect the OBIRCH signal. The decrease in the total resistance of the metal line without any change in the amount of the resistance increase under laser illumination is found to be the main cause of the OBIRCH signal enhancement under low temperature measurement.

Horn functions are Boolean functions where each of the prime implicants contains at most one negative literal. A class of Boolean functions is considered in this letter where a single term containing two negative literals is added by logical-or operation to a Horn function. We show that the function does not have any prime implicant containing three negative literals. We also show that if two terms containing two negative literals are added to a Horn function, then it may have many prime implicants all of which contain three negative literals. We show that it is P-complete to determine whether a given Boolean function in disjunctive normal form of the considered class is a tautology.

We have investigated the electromotive force (EMF) of a composite sample consisting of a Π-type thermoelectric power generation structure with a pair of n- and p-type Si wafers and piezoelectric devices in order to collect electricity from vibration energy and thermal energy, simultaneously. The observed EMF was obtained by superimposing the oscillating EMF of vibration energy on the constant EMF of thermal energy. Therefore, we have improved the composite sample with diodes for rectifying the oscillating EMF. As a result, the full-wave rectification and the preservation of EMF amplitude were realized. From the frequency dependence, it was found that the dielectric loss of the piezoelectric device influences the amplitude and the time delay in the EMF.