This paper deals with the problems in testing large mixed-signal ICs. To help generating test patterns of these larger mixed-signal circuits for a functional test, a fast fault simulation algorithm and a fault model voltage stuck-at fault" which the algorithm is based on, are proposed. A voltage stuck-at fault is that a signal line sticks its voltage level at a certain constant. Under an assumption that blocks in a circuit are designed as identically current-independent, i.e. their input impedance can be regarded as infinite and their output impedance as zero, fault simulation can be realized by the event driven method and the concurrent method and can detect voltage stuck-at faults. These methods are essential for digital fault simulation and very effective to high speed simulation, although they were impossible for an analog or mixed-signal circuit by a conventional algorithm. Furthermore, the efficiency of the simulation is improved because I/O relation of blocks is approximated to a stepwise linear function. The above techniques and methods make fault simulation for a mixed-signal circuit possible in practical use. Actually, a fault simulator was implemented, then some test circuits were simulated. The simulator is really faster than conventional simulation based on circuit simulation. Next, fault analysis was applied to several bipolar ICs to verify the validity of the fault model voltage stuck-at faults". Analyses of open and short faults between terminals of transistors and resistors show that this fault model has sufficient coverage (more than 50%) to test mixed-signal circuit.