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[Author] Run TAN(1hit)

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  • The Comparison of Attention Mechanisms with Different Embedding Modes for Performance Improvement of Fine-Grained Classification

    Wujian YE  Run TAN  Yijun LIU  Chin-Chen CHANG  

     
    PAPER-Core Methods

      Pubricized:
    2021/12/22
      Vol:
    E106-D No:5
      Page(s):
    590-600

    Fine-grained image classification is one of the key basic tasks of computer vision. The appearance of traditional deep convolutional neural network (DCNN) combined with attention mechanism can focus on partial and local features of fine-grained images, but it still lacks the consideration of the embedding mode of different attention modules in the network, leading to the unsatisfactory result of classification model. To solve the above problems, three different attention mechanisms are introduced into the DCNN network (like ResNet, VGGNet, etc.), including SE, CBAM and ECA modules, so that DCNN could better focus on the key local features of salient regions in the image. At the same time, we adopt three different embedding modes of attention modules, including serial, residual and parallel modes, to further improve the performance of the classification model. The experimental results show that the three attention modules combined with three different embedding modes can improve the performance of DCNN network effectively. Moreover, compared with SE and ECA, CBAM has stronger feature extraction capability. Among them, the parallelly embedded CBAM can make the local information paid attention to by DCNN richer and more accurate, and bring the optimal effect for DCNN, which is 1.98% and 1.57% higher than that of original VGG16 and Resnet34 in CUB-200-2011 dataset, respectively. The visualization analysis also indicates that the attention modules can be easily embedded into DCNN networks, especially in the parallel mode, with stronger generality and universality.