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[Author] Seiichi TSUJI(1hit)

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  • Analysis of High Power Amplifier Instability due to f0/2 Loop Oscillation

    Tadashi TAKAGI  Mitsuru MOCHIZUKI  Yukinobu TARUI  Yasushi ITOH  Seiichi TSUJI  Yasuo MITSUI  

     
    PAPER

      Vol:
    E78-C No:8
      Page(s):
    936-943

    A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f0-wave) decreases at some compression point where a half of the fundamental wave (f0/2-wave) is observed, it has been found that this instability is caused by an f0/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.