Electron and hole transport in polymethylphenylsilane (PMPS) containing anthracene units in the polymer backbone (PMPS-AN) has been studied by time-of-flight and electrophotographic measurements. It is found that the hole transport of PMPS-AN is non-dispersive and exhibits thermally activated behavior. The anthracene incorporation to the polymer backbone of PMPS slightly decreases the hole drift mobility of PMPS-AN because of the increase in energetic disorder. In PMPS-AN, the electron transport, which has not been observed in organic polysilanes, is clearly seen. In contrast to the hole transport, the electron transport exhibits anomalous dispersion of the transit times and the electron drift mobility is independent of temperature. It is suggested that the electron transport is due to geometrical disorder of electron hopping sites (anthracene units). From the electrophotographic measurements, we discuss the applicability of PMPS-AN to photoreceptors and estimate the Schubweg of electrons in PMPS-AN.