When used for automotive applications, microcomputers have to meet two requirements more demanding than those for general use. One of these requirements is to respond to external events within a time scale of microseconds; the other is the high quality and high reliability necessary for the severe environmental operating conditions and the ambitious market requirements inherent to automotive applications. These needs especially the latter one have been responded to by further elaboration of each basic technology involved in semiconductor manufacturing. At the same time, various logic parts have been built into the microcomputer. This paper deals with several design approaches to the high quality and high reliability objective. First, testability improvement by the logical separation method focusing on the logic simulation model for generating test vectors, which enables us to reduce the time required for test vector development in half. Next, noise suppression methods to gain electromagnetic compatibility (EMC). Then, simplified memory transistor's analysis to evaluate the V/I-characteristics directly via external pins without opening the model seal, removing the passivation and placing a probe needle on the chip. Finally, increased reliability of on-chip EPROM using a special circuit raising the threshold value by approximately 1(V) compared to EPROM's without such a circuit.