The search functionality is under construction.
The search functionality is under construction.

Author Search Result

[Author] Tatsuo YOSHIE(1hit)

1-1hit
  • High Reliability Design Method of LC Tuning Circuit and Substantiation of Aging Characteristics for 20 Years

    Mitsugi SAITA  Tatsuo YOSHIE  Katsumi WATANABE  Kiyoshi MURAMORI  

     
    PAPER-Evaluation of Reliability Improvement

      Vol:
    E77-A No:1
      Page(s):
    213-219

    In 1963, the authors began to develop a tuning circuit (hereafter referred to as the 'circuit') consisting of an inductor, fixed capacitors and a variable capacitor. The circuit required very high accuracy and stability, and the aging influence on resonant frequency needed to be Δf/f0 0.12% for 20 years. When we started, there was no methodology available for designing such a long-term stable circuit, so we reinvestigated our previous studies concerning aging characteristics and formed a design concept. We designed the circuit by bearing in mind that an inductor was subject to natural and stress demagnetization (as indicated by disaccommodation), and assumed that a capacitor changed its characteristics linearly over a logarithmic scale of time. (This assumption was based on short-term test results derived from previous studies.) We measured the aging characteristics of the circuits at room temperature for 20 years, from 1966. The measurement results from the 20-year study revealed that the aging characteristics predicted by the design concept were reasonably accurate.