Process and temperature variations have become a serious concern for ultra-low voltage (ULV) technology. The clock generator is the essential component for the ULV very-large-scale integration (VLSI). MOSFETs that are operated in the sub-threshold region are widely applied for ULV technology. However, MOSFETs at subthreshold region have relatively high variations with process and temperature. In this paper, process and temperature variations on the clock generators have been studied. This paper presents an ultra-low voltage 2.4GHz CMOS voltage controlled oscillator with temperature and process compensation. A new all-digital auto compensated mechanism to reduce process and temperature variation without any laser trimming is proposed. With the compensated circuit, the VCO frequency-drift is 16.6 times the improvements of the uncompensated one as temperature changes. Furthermore, it also provides low jitter performance.

A multi-phase crystal-less clock generator (MPCLCG) with a process-voltage-temperature (PVT) calibration circuit is proposed. It operates at 192 MHz with 8 phases outputs, and is implemented as a 0.18µm CMOS process for digital power management systems. A temperature calibrated circuit is proposed to align operational frequency under process and supply voltage variations. It occupies an area of 65µm × 75µm and consumes 1.1mW with the power supply of 1.8V. Temperature coefficient (TC) is 69.5ppm/°C from 0 to 100°C, and 2-point calibration is applied to calibrate PVT variation. The measured period jitter is a 4.58-ps RMS jitter and a 34.55-ps peak-to-peak jitter (P2P jitter) at 192MHz within 12.67k-hits. At 192MHz, it shows a 1-MHz-offset phase noise of -102dBc/Hz. Phase to phase errors and duty cycle errors are less than 5.5% and 4.3%, respectively.