A de-embedding technique for the measurement of very small parasitic capacitances of package or small module interconnects is presented. At high frequencies small parasitic capacitances become important, and measurement probes can strongly affect measurement results. The present technique is based on additional measurements with only one tip of the probe touching one conductor, while the second tip is kept floating on the substrate. A necessary condition for its application is that the measured capacitance does not depend on the position of the floating probe tip. Measurements with inverted probe tip polarities are also used. In this way, the capacitances between probe tips and DUT can be estimated together with the parasitic capacitances of interest. Depending on the required accuracy, de-embedding of different orders have been introduced, which consider capacitance configurations of increasing complexity. The technique requires the solution of one or more systems of non-linear equations. In the present example the minimization of the norm of the residual of the system has been treated as a least squares problem, and has been solved numerically with MATLAB. The accuracy of the measurement can be also approximately estimated with the residual. As application example, a small module with power and ground planes has been considered. Two different probes have been used. Even though the stray capacitances of the probes are very different, the values of the extracted parasitic capacitances are in agreement with each other. The accuracy has been verified also with simulation results. To this purpose, a combination of known formulas from the literature, a 2D Finite Element Method (FEM) tool and a 3D Boundary Element Method (BEM) tool have been used. A high accuracy can be obtained, even when a strong capacitive coupling between probe ground and DUT is present. The technique can be applied also when only a subset of measurement results are available.

Power and ground planes on multilayer PCBs can effectively radiate electromagnetic fields excited by the IC simultaneous switching noise. The high frequency electromagnetic radiation is often calculated from the electric field along the edge of the PCB, which can be estimated with a cavity model using magnetic walls. The excitation of the cavity modes is related to the via current passing through the power bus planes at the interconnection between IC package and PCB. Usually the attention is focused on the differential-mode current of the package pins, but in the present paper it is shown that the common-mode current flowing out from package pins plays a very important role in the excitation of cavity modes, and its neglect implies a fatal underestimation of the electromagnetic radiation from the power bus planes in some circumstances. A second important contribute to the radiation is given by the common mode current on the pins, together with the current flowing on the PCB ground plane. With the proposed equivalent circuit, the effectiveness of decoupling inductors depending on their location and on the value of the parasitic capacitance is studied.

Power supply noise generated by integrated circuits is one of the major sources of electromagnetic radiation from printed circuit boards (PCB). The reduction of power supply noise can be realized by means of devices that bypass the current among power supply planes, such as bypass capacitors and ground vias. In the present work, the effect of current bypass devices on the far field radiation from multilayer PCBs is represented in terms of the ratio between the far field after and before their introduction, and it is estimated by means of the power transported by the ‘radiation effective forward wave’ in infinite power supply planes. This approach is computationally very efficient and yelds improved EMC designs for power supply planes in realistic PCBs, for example by selecting the position of stitching ground vias. The results are confirmed by a comparison with commercial tools. Forward wave analysis can be used also to study the vertical distribution of the power supply noise in multilayer PCBs. This allows to understand some important noise propagation mechanisms that are related to power and signal integrity as well, and to take low-cost countermeasures at early stage of PCB design.