This paper discusses on the methods and their numerical simulation results of the one-dimensional profiling of dielectric targets in the direction of electromagnetic wave incidence. Two different inverse profiling algorithms are proposed. First method is based on the Rayleigh approximation. The inverse profiling is carried out by performing the Fourier transformation of the backscattered field in frequency domain. In this method, the dielectric constant of the target is assumed as known beforehand. The second method is based on the extended physical optics (EPO) method. The EPO method was proposed for calculating the backscattering cross section for a conducting scatterer, however, we apply the EPO method to the inverse problem of the dielectric target whose dielectric constant is not known. The validity and limitation of each method are tested numerically for spherical and spheroidal targets.