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Kazuhito ITO Yuto ISHIHARA Shinichi NISHIZAWA
As LSI chips integrate more transistors and the operating power supply voltage decreases, LSI chips are becoming more vulnerable to the soft error caused by neutrons induced from cosmic rays. The soft error is detected by comparing the duplicated operation results in double modular redundancy (DMR) and the error is corrected by re-executing necessary operations. In this paper, based on the error recovery scheme of re-executing necessary operations, the minimization of the vote operations for error checking with respect to given resource constraints is considered. An ILP model for the optimal solution to the problem is presented and a heuristic algorithm is proposed to minimize the vote operations.