Narrow swipe sensor based systems have drawn more and more attention in recent years. However, the size of captured image is significantly smaller than that obtained from the traditional area fingerprint sensor. Under this condition the available minutiae number is also limited. Therefore, only employing minutiae with the standard associated feature can hardly achieve high verification accuracy. To solve this problem, we present a novel Hybrid Minutiae Descriptor (HMD) which consists of two modules. The first one: Minutiae Ridge-Valley Orientation Descriptor captures the orientation information around minutia and also the trace points located at associated ridge and valley. The second one: Gabor Binary Code extracts and codes the image patch around minutiae. The proposed HMD enhances the representation capability of minutiae feature, and can be matched very efficiently. Experiments conducted over public databases and the database captured by the narrow swipe sensor show that this innovative method gives rise to significant improvements in reducing FRR (False Reject Rate) and EER (Equal Error Rate).

Narrow swipe sensor has been widely used in embedded systems such as smart-phone. However, the size of captured image is much smaller than that obtained by the traditional area sensor. Therefore, the limited template coverage is the performance bottleneck of such kind of systems. Aiming to increase the geometry coverage of templates, a novel fingerprint template feature synthesis scheme is proposed in the present study. This method could synthesis multiple input fingerprints into a wider template by clustering the minutiae descriptors. The proposed method consists of two modules. Firstly, a user behavior-based Registration Pattern Inspection (RPI) algorithm is proposed to select the qualified candidates. Secondly, an iterative clustering algorithm Modified Fuzzy C-Means (MFCM) is proposed to process the large amount of minutiae descriptors and then generate the final template. Experiments conducted over swipe fingerprint database validate that this innovative method gives rise to significant improvements in reducing FRR (False Reject Rate) and EER (Equal Error Rate).