The search functionality is under construction.
The search functionality is under construction.

Keyword Search Result

[Keyword] microwave holography(2hit)

1-2hit
  • An Imaging System for Electro-Magnetic Noise Source Identification

    Hiroshi HIRAYAMA  Yoshio KAMI  

     
    PAPER-Electromagnetic Compatibility(EMC)

      Vol:
    E86-B No:4
      Page(s):
    1377-1382

    In this paper, we propose a passive imaging system for noise-source identification using time-domain waveform sampling. The fundamental concepts are based on optics theory. A waveform of a diffracted field over an entrance pupil is obtained by a digitizing oscilloscope. The phase distributions over the entrance pupil for each frequency are calculated by using Fourier transform of the acquired waveforms. Thus, an image on the focal plane is reconstructed by using inverse Fresnel transform. The most significant advantage of the proposed method is that an image for each frequency can be obtained separately. We confirmed that the proposed method can be used for practical noise-source identification, by experimentally obtaining images for an emission from personal computers.

  • An Imaging System for EM Emitting Sources Using a Six-Port Interferometer

    Hiroshi HIRAYAMA  Toshiyuki YAKABE  Yoshio KAMI  

     
    PAPER

      Vol:
    E84-C No:12
      Page(s):
    1885-1891

    A Fourier-optics based imaging system for electromagnetic interference (EMI) sources is presented. It is necessary to decrease undesired emissions in order to meet EMI requirements. To investigate this problem, a visualization of electromagnetic (EM) emitting fields is very useful. In this paper, we propose a passive imaging system of EM emitting fields based on Fourier optics. Amplitude and phase values of diffracted fields on an entrance pupil are acquired by using a six-port interferometer. The measured EM fields are then processed on a computer, and an image is retrieved using an inverse Fresnel transform. Experiments are presented, which demonstrate the potential of the proposed method. The proposed system is useful not only in the field of electromagnetic compatibility (EMC), but also for scientific elucidation to discuss the optics and microwave theory of the same viewpoint.