A method for estimating complex permittivity of a material using a rectangular waveguide with a flange is presented by the finite difference time domain (FDTD) method. An advantage of the present method is that it is not necessary to vary the material structure in order to insert it into the waveguide. Therefore estimation errors related to the dimensions of the material are almost negligible. In this case, fluoridated rubber is chosen as the low-loss material. The comparison of the complex permittivity of the material determined by the present method with FDTD and the conventional waveguide method at 10 GHz is performed. It was confirmed that the present method is effective for estimating the complex permittivity under the condition that the length of the flange is about 50 mm (1.7λ) square.

A new method for measuring the scattering coefficient using a metal-plate reflector was developed in order to provide a non-destructive way for the assessment of microwave materials in free space. By displacing the position of the metal-plate reflector on the specimen to be tested, the incident wave and the scattered wave from the measured area were determined without the influence of extraneous waves such as the direct coupling between transmitting and receiving antennas and scattered waves from background objects. Because the behavior of a metal-plate reflector is similar to that of an optical shutter in optics, our new scattering measurement system enables us to measure both backward- and forward-scattering coefficients of small regions of the specimen for various types of materials in a non-destructive manner. Our study examined the metal-plate size dependence of the complex reflection and transmission coefficients of some dielectric sheet samples. The measured data indicated that the reflection and transmission coefficients of a Bakelite flat plate and Styrofoam sheet were constant for various sizes of metal plates at the X-band.

Preliminary experiments on non-destructive quantitative analysis of water vapor density in halogen lamps have been carried out. A working curve showing a relation between absorbance and water vapor density was successfully obtained by using frequency-stabilized InGaAsP/InP semiconductor laser spectrometric system.