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[Keyword] run-length code(2hit)

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  • Extended-Domain Golomb Code and Symmetry of Relative Redundancy

    Ryosuke SUGIURA  Yutaka KAMAMOTO  Takehiro MORIYA  

     
    PAPER-Coding Theory

      Pubricized:
    2021/02/08
      Vol:
    E104-A No:8
      Page(s):
    1033-1042

    This paper presents extended-domain Golomb (XDG) code, an extension of Golomb code for sparse geometric sources as well as a generalization of extended-domain Golomb-Rice (XDGR) code, based on the idea of almost instantaneous fixed-to-variable length (AIFV) codes. Showing that the XDGR encoding can be interpreted as extended usage of the code proposed in the previous works, this paper discusses the following two facts: The proposed XDG code can be constructed as an AIFV code relating to Golomb code as XDGR code does to Rice code; XDG and Golomb codes are symmetric in the sense of relative redundancy. The proposed XDG code can be efficiently used for losslessly compressing geometric sources too sparse for the conventional Golomb and Rice codes. According to the symmetry, its relative redundancy is guaranteed to be as low as Golomb code compressing non-sparse geometric sources. Awing to this fact, the parameter of the proposed XDG code, which is more finely tunable than the conventional XDGR code, can be optimized for given inputs using the conventional techniques. Therefore, it is expected to be more useful for many coding applications that deal with geometric sources at low bit rates.

  • Test Data Compression Using a Hybrid Run-Length Code Method

    Yongmin HUR  

     
    LETTER-Image Processing and Multimedia Systems

      Vol:
    E88-D No:7
      Page(s):
    1607-1609

    This letter proposes a run-length code based test data compression technique capable of efficient compression. The proposed test compression method is based on a hybrid run-length encoding, which greatly reduces test data storage on the tester. The code words are carefully selected so as to increase the compression ratio for the test data. Also, a heuristic mapping algorithm and a scan latch reordering method for don't care values in the test cubes increase the compression ratio. Results indicate that the proposed code and heuristic mapping schemes are very efficient in reducing test data. Reduced test data results in less test storage and test time.