Near-field imaging has been intensively investigated to observe the shape and the physical properties of objects, aiming at wide applications in the areas of science and engineering. In this research, by using 60 GHz band waveguide-type microscopic aperture probe, the characteristics of the near-field imaging in transmission mode have been studied by simulation and experiment. The probe is made of a WR-15 rectangular waveguide with end-shielded metal plate and a 0.5 mm-diameter aperture. In the simulation, at first, the electric field distribution at the aperture, at the rear (waveguide) and the front positions (free space) are presented. Second, the transmitted electric fields are presented for three cases: (a) scanning of a dielectric slit, (b) by varying the distance between the aperture and a dielectric sample, and (c) scanning of a dielectric groove. In the experiment, the lateral resolution with a two-slit and the depth resolution with grooves having various depths in rectangular format are described and the results show both resolutions to be much shorter than the wavelength. Finally, the scanned images of the letter N punched through a dielectric material and a leaf are demonstrated.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Somboon THEERAWISITPONG, Toshitatsu SUZUKI, Tadahiro NEGISHI, Yasuo WATANABE, "Near-Field Transmission Imaging by 60 GHz Band Waveguide-Type Microscopic Aperture Probe" in IEICE TRANSACTIONS on Communications,
vol. E90-B, no. 9, pp. 2387-2393, September 2007, doi: 10.1093/ietcom/e90-b.9.2387.
Abstract: Near-field imaging has been intensively investigated to observe the shape and the physical properties of objects, aiming at wide applications in the areas of science and engineering. In this research, by using 60 GHz band waveguide-type microscopic aperture probe, the characteristics of the near-field imaging in transmission mode have been studied by simulation and experiment. The probe is made of a WR-15 rectangular waveguide with end-shielded metal plate and a 0.5 mm-diameter aperture. In the simulation, at first, the electric field distribution at the aperture, at the rear (waveguide) and the front positions (free space) are presented. Second, the transmitted electric fields are presented for three cases: (a) scanning of a dielectric slit, (b) by varying the distance between the aperture and a dielectric sample, and (c) scanning of a dielectric groove. In the experiment, the lateral resolution with a two-slit and the depth resolution with grooves having various depths in rectangular format are described and the results show both resolutions to be much shorter than the wavelength. Finally, the scanned images of the letter N punched through a dielectric material and a leaf are demonstrated.
URL: https://global.ieice.org/en_transactions/communications/10.1093/ietcom/e90-b.9.2387/_p
Copy
@ARTICLE{e90-b_9_2387,
author={Somboon THEERAWISITPONG, Toshitatsu SUZUKI, Tadahiro NEGISHI, Yasuo WATANABE, },
journal={IEICE TRANSACTIONS on Communications},
title={Near-Field Transmission Imaging by 60 GHz Band Waveguide-Type Microscopic Aperture Probe},
year={2007},
volume={E90-B},
number={9},
pages={2387-2393},
abstract={Near-field imaging has been intensively investigated to observe the shape and the physical properties of objects, aiming at wide applications in the areas of science and engineering. In this research, by using 60 GHz band waveguide-type microscopic aperture probe, the characteristics of the near-field imaging in transmission mode have been studied by simulation and experiment. The probe is made of a WR-15 rectangular waveguide with end-shielded metal plate and a 0.5 mm-diameter aperture. In the simulation, at first, the electric field distribution at the aperture, at the rear (waveguide) and the front positions (free space) are presented. Second, the transmitted electric fields are presented for three cases: (a) scanning of a dielectric slit, (b) by varying the distance between the aperture and a dielectric sample, and (c) scanning of a dielectric groove. In the experiment, the lateral resolution with a two-slit and the depth resolution with grooves having various depths in rectangular format are described and the results show both resolutions to be much shorter than the wavelength. Finally, the scanned images of the letter N punched through a dielectric material and a leaf are demonstrated.},
keywords={},
doi={10.1093/ietcom/e90-b.9.2387},
ISSN={1745-1345},
month={September},}
Copy
TY - JOUR
TI - Near-Field Transmission Imaging by 60 GHz Band Waveguide-Type Microscopic Aperture Probe
T2 - IEICE TRANSACTIONS on Communications
SP - 2387
EP - 2393
AU - Somboon THEERAWISITPONG
AU - Toshitatsu SUZUKI
AU - Tadahiro NEGISHI
AU - Yasuo WATANABE
PY - 2007
DO - 10.1093/ietcom/e90-b.9.2387
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E90-B
IS - 9
JA - IEICE TRANSACTIONS on Communications
Y1 - September 2007
AB - Near-field imaging has been intensively investigated to observe the shape and the physical properties of objects, aiming at wide applications in the areas of science and engineering. In this research, by using 60 GHz band waveguide-type microscopic aperture probe, the characteristics of the near-field imaging in transmission mode have been studied by simulation and experiment. The probe is made of a WR-15 rectangular waveguide with end-shielded metal plate and a 0.5 mm-diameter aperture. In the simulation, at first, the electric field distribution at the aperture, at the rear (waveguide) and the front positions (free space) are presented. Second, the transmitted electric fields are presented for three cases: (a) scanning of a dielectric slit, (b) by varying the distance between the aperture and a dielectric sample, and (c) scanning of a dielectric groove. In the experiment, the lateral resolution with a two-slit and the depth resolution with grooves having various depths in rectangular format are described and the results show both resolutions to be much shorter than the wavelength. Finally, the scanned images of the letter N punched through a dielectric material and a leaf are demonstrated.
ER -