The Determination of Radiated Emissions Limits for Integrated Circuits within Telecommunications Equipment
Summary :
This paper outlines an approach for specifying emissions performance at the component level. The objective is to move towards an industry specification for radiated emissions from large integrated circuits in order to facilitate cost effective system design for EMI compliance. Simple models of the mechanisms of direct chip radiation are provided based on the physical and electrical structure of large integrated circuits. These models lead to simple algorithms for estimating the total IC radiation based on IC design parameters. These models can be related to proposed emissions limits based on the desired application of the IC. Finally a measurement methodology is described which permits evaluation of the IC's relative to the limits and provides the information required to make detailed simulation models.
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- IEICE TRANSACTIONS on Communications Vol.E75-B No.3 pp.124-130
- Publication Date
- 1992/03/25
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section INVITED PAPER (Special Issue on Measurements and Control of Electromagnetic Interference)
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Richard R. GOULETTE, Robert J. CRAWHALL, Stanislus K. XAVIER, "The Determination of Radiated Emissions Limits for Integrated Circuits within Telecommunications Equipment" in IEICE TRANSACTIONS on Communications,
vol. E75-B, no. 3, pp. 124-130, March 1992, doi: .
Abstract: This paper outlines an approach for specifying emissions performance at the component level. The objective is to move towards an industry specification for radiated emissions from large integrated circuits in order to facilitate cost effective system design for EMI compliance. Simple models of the mechanisms of direct chip radiation are provided based on the physical and electrical structure of large integrated circuits. These models lead to simple algorithms for estimating the total IC radiation based on IC design parameters. These models can be related to proposed emissions limits based on the desired application of the IC. Finally a measurement methodology is described which permits evaluation of the IC's relative to the limits and provides the information required to make detailed simulation models.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e75-b_3_124/_p
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@ARTICLE{e75-b_3_124,
author={Richard R. GOULETTE, Robert J. CRAWHALL, Stanislus K. XAVIER, },
journal={IEICE TRANSACTIONS on Communications},
title={The Determination of Radiated Emissions Limits for Integrated Circuits within Telecommunications Equipment},
year={1992},
volume={E75-B},
number={3},
pages={124-130},
abstract={This paper outlines an approach for specifying emissions performance at the component level. The objective is to move towards an industry specification for radiated emissions from large integrated circuits in order to facilitate cost effective system design for EMI compliance. Simple models of the mechanisms of direct chip radiation are provided based on the physical and electrical structure of large integrated circuits. These models lead to simple algorithms for estimating the total IC radiation based on IC design parameters. These models can be related to proposed emissions limits based on the desired application of the IC. Finally a measurement methodology is described which permits evaluation of the IC's relative to the limits and provides the information required to make detailed simulation models.},
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - The Determination of Radiated Emissions Limits for Integrated Circuits within Telecommunications Equipment
T2 - IEICE TRANSACTIONS on Communications
SP - 124
EP - 130
AU - Richard R. GOULETTE
AU - Robert J. CRAWHALL
AU - Stanislus K. XAVIER
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E75-B
IS - 3
JA - IEICE TRANSACTIONS on Communications
Y1 - March 1992
AB - This paper outlines an approach for specifying emissions performance at the component level. The objective is to move towards an industry specification for radiated emissions from large integrated circuits in order to facilitate cost effective system design for EMI compliance. Simple models of the mechanisms of direct chip radiation are provided based on the physical and electrical structure of large integrated circuits. These models lead to simple algorithms for estimating the total IC radiation based on IC design parameters. These models can be related to proposed emissions limits based on the desired application of the IC. Finally a measurement methodology is described which permits evaluation of the IC's relative to the limits and provides the information required to make detailed simulation models.
ER -
English
