IEICE TRANSACTIONS on Communications
Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing
Summary :
The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial (in depth) structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps (DEM) from either Polarimetric (scattering matrix) or Interferometric (single platform: dual antenna) SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.
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- IEICE TRANSACTIONS on Communications Vol.E83-B No.9 pp.1906-1915
- Publication Date
- 2000/09/25
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- Type of Manuscript
- Special Section INVITED PAPER (Special Issue on Advances in Radar Systems)
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Wolfgang-Martin BOERNER, Yoshio YAMAGUCHI, "Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing" in IEICE TRANSACTIONS on Communications,
vol. E83-B, no. 9, pp. 1906-1915, September 2000, doi: .
Abstract: The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial (in depth) structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps (DEM) from either Polarimetric (scattering matrix) or Interferometric (single platform: dual antenna) SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e83-b_9_1906/_p
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@ARTICLE{e83-b_9_1906,
author={Wolfgang-Martin BOERNER, Yoshio YAMAGUCHI, },
journal={IEICE TRANSACTIONS on Communications},
title={Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing},
year={2000},
volume={E83-B},
number={9},
pages={1906-1915},
abstract={The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial (in depth) structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps (DEM) from either Polarimetric (scattering matrix) or Interferometric (single platform: dual antenna) SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.},
keywords={},
doi={},
ISSN={},
month={September},}
Copy
TY - JOUR
TI - Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing
T2 - IEICE TRANSACTIONS on Communications
SP - 1906
EP - 1915
AU - Wolfgang-Martin BOERNER
AU - Yoshio YAMAGUCHI
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E83-B
IS - 9
JA - IEICE TRANSACTIONS on Communications
Y1 - September 2000
AB - The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial (in depth) structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps (DEM) from either Polarimetric (scattering matrix) or Interferometric (single platform: dual antenna) SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.
ER -
English
