The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-parameters . This paper demonstrates a scheme for analyzing permittivity measurement errors in the Waveguide-Penetration method. The sources of errors are categorized into systematic and random error sources. Systematic errors in the values of the sample and waveguide holes diameters, the effect of sample's length, and the influence of ambient temperature are investigated and corrected for. Potential random error sources such as imperfect TRL calibration elements, VNA thermal noise, sample loading, and test-port cable flexure are analyzed and their contribution to random errors are estimated.
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Alfred KIK, Atsuhiro NISHIKATA, "Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method" in IEICE TRANSACTIONS on Communications,
vol. E93-B, no. 7, pp. 1697-1706, July 2010, doi: 10.1587/transcom.E93.B.1697.
Abstract: The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-parameters . This paper demonstrates a scheme for analyzing permittivity measurement errors in the Waveguide-Penetration method. The sources of errors are categorized into systematic and random error sources. Systematic errors in the values of the sample and waveguide holes diameters, the effect of sample's length, and the influence of ambient temperature are investigated and corrected for. Potential random error sources such as imperfect TRL calibration elements, VNA thermal noise, sample loading, and test-port cable flexure are analyzed and their contribution to random errors are estimated.
URL: https://global.ieice.org/en_transactions/communications/10.1587/transcom.E93.B.1697/_p
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@ARTICLE{e93-b_7_1697,
author={Alfred KIK, Atsuhiro NISHIKATA, },
journal={IEICE TRANSACTIONS on Communications},
title={Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method},
year={2010},
volume={E93-B},
number={7},
pages={1697-1706},
abstract={The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-parameters . This paper demonstrates a scheme for analyzing permittivity measurement errors in the Waveguide-Penetration method. The sources of errors are categorized into systematic and random error sources. Systematic errors in the values of the sample and waveguide holes diameters, the effect of sample's length, and the influence of ambient temperature are investigated and corrected for. Potential random error sources such as imperfect TRL calibration elements, VNA thermal noise, sample loading, and test-port cable flexure are analyzed and their contribution to random errors are estimated.},
keywords={},
doi={10.1587/transcom.E93.B.1697},
ISSN={1745-1345},
month={July},}
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TY - JOUR
TI - Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method
T2 - IEICE TRANSACTIONS on Communications
SP - 1697
EP - 1706
AU - Alfred KIK
AU - Atsuhiro NISHIKATA
PY - 2010
DO - 10.1587/transcom.E93.B.1697
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E93-B
IS - 7
JA - IEICE TRANSACTIONS on Communications
Y1 - July 2010
AB - The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-parameters . This paper demonstrates a scheme for analyzing permittivity measurement errors in the Waveguide-Penetration method. The sources of errors are categorized into systematic and random error sources. Systematic errors in the values of the sample and waveguide holes diameters, the effect of sample's length, and the influence of ambient temperature are investigated and corrected for. Potential random error sources such as imperfect TRL calibration elements, VNA thermal noise, sample loading, and test-port cable flexure are analyzed and their contribution to random errors are estimated.
ER -