Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers
Summary :
400 V DC power distribution systems for data centers require a fast response DC circuit breaker is required. The semiconductor DC circuit breaker is an important key technology in DC power distribution systems. This paper considers the malfunction of Silicon Carbide- Static Induction Transistor (SiC-SIT) based DC circuit breakers in 400 V DC power distribution systems for data centers. The malfunction mechanism is explained, and a solution is proposed. Investigations are achieved by MATLAB/Simulink and experimental verification.
- Publication
- IEICE TRANSACTIONS on Communications Vol.E95-B No.6 pp.1990-1996
- Publication Date
- 2012/06/01
- Publicized
- Online ISSN
- 1745-1345
- DOI
- 10.1587/transcom.E95.B.1990
- Type of Manuscript
- PAPER
- Category
- Energy in Electronics Communications
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Seiya ABE, Sihun YANG, Masahito SHOYAMA, Tamotsu NINOMIYA, Akira MATSUMOTO, Akiyoshi FUKUI, "Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers" in IEICE TRANSACTIONS on Communications,
vol. E95-B, no. 6, pp. 1990-1996, June 2012, doi: 10.1587/transcom.E95.B.1990.
Abstract: 400 V DC power distribution systems for data centers require a fast response DC circuit breaker is required. The semiconductor DC circuit breaker is an important key technology in DC power distribution systems. This paper considers the malfunction of Silicon Carbide- Static Induction Transistor (SiC-SIT) based DC circuit breakers in 400 V DC power distribution systems for data centers. The malfunction mechanism is explained, and a solution is proposed. Investigations are achieved by MATLAB/Simulink and experimental verification.
URL: https://global.ieice.org/en_transactions/communications/10.1587/transcom.E95.B.1990/_p
Copy
@ARTICLE{e95-b_6_1990,
author={Seiya ABE, Sihun YANG, Masahito SHOYAMA, Tamotsu NINOMIYA, Akira MATSUMOTO, Akiyoshi FUKUI, },
journal={IEICE TRANSACTIONS on Communications},
title={Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers},
year={2012},
volume={E95-B},
number={6},
pages={1990-1996},
abstract={400 V DC power distribution systems for data centers require a fast response DC circuit breaker is required. The semiconductor DC circuit breaker is an important key technology in DC power distribution systems. This paper considers the malfunction of Silicon Carbide- Static Induction Transistor (SiC-SIT) based DC circuit breakers in 400 V DC power distribution systems for data centers. The malfunction mechanism is explained, and a solution is proposed. Investigations are achieved by MATLAB/Simulink and experimental verification.},
keywords={},
doi={10.1587/transcom.E95.B.1990},
ISSN={1745-1345},
month={June},}
Copy
TY - JOUR
TI - Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers
T2 - IEICE TRANSACTIONS on Communications
SP - 1990
EP - 1996
AU - Seiya ABE
AU - Sihun YANG
AU - Masahito SHOYAMA
AU - Tamotsu NINOMIYA
AU - Akira MATSUMOTO
AU - Akiyoshi FUKUI
PY - 2012
DO - 10.1587/transcom.E95.B.1990
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E95-B
IS - 6
JA - IEICE TRANSACTIONS on Communications
Y1 - June 2012
AB - 400 V DC power distribution systems for data centers require a fast response DC circuit breaker is required. The semiconductor DC circuit breaker is an important key technology in DC power distribution systems. This paper considers the malfunction of Silicon Carbide- Static Induction Transistor (SiC-SIT) based DC circuit breakers in 400 V DC power distribution systems for data centers. The malfunction mechanism is explained, and a solution is proposed. Investigations are achieved by MATLAB/Simulink and experimental verification.
ER -
English
