IEICE TRANSACTIONS on Communications
Asymptotic Calculation of the Intensity of Millimeter Wave Propagation over an Undulating Surface Using the Diffraction Integral with a High-Degree Phase Function
Summary :
This paper proposes an asymptotic method for calculating the received intensity of multi-path millimeter waves transmitted over an undulating surface. This method is a generalization of the asymptotic method that the authors previously derived, based on a quartic phase function approximation, from the physical optics integral expression of the received intensity. The applicability of the previous method is limited to ratios of transmission distance (D) to surface undulation wavelength (λs) of roughly less than 2. This is because the method is based on a quartic phase function approximation. In this paper, this limitation is resolved through this method's generalization, which is achieved by incorporating a technique for calculating the diffraction integral with a higher-degree phase function by using the steepest descent technique with a procedure for systematically identifying the active saddles of the phase function. Numerical examples demonstrate that the proposed asymptotic method can attain calculation accuracy comparable with the physical optics method, even in the case of large D/λs values.
- Publication
- IEICE TRANSACTIONS on Communications Vol.E95-B No.10 pp.3206-3214
- Publication Date
- 2012/10/01
- Publicized
- Online ISSN
- 1745-1345
- DOI
- 10.1587/transcom.E95.B.3206
- Type of Manuscript
- PAPER
- Category
- Antennas and Propagation
Authors
Keyword
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Toshio IHARA, Kenji SEKI, "Asymptotic Calculation of the Intensity of Millimeter Wave Propagation over an Undulating Surface Using the Diffraction Integral with a High-Degree Phase Function" in IEICE TRANSACTIONS on Communications,
vol. E95-B, no. 10, pp. 3206-3214, October 2012, doi: 10.1587/transcom.E95.B.3206.
Abstract: This paper proposes an asymptotic method for calculating the received intensity of multi-path millimeter waves transmitted over an undulating surface. This method is a generalization of the asymptotic method that the authors previously derived, based on a quartic phase function approximation, from the physical optics integral expression of the received intensity. The applicability of the previous method is limited to ratios of transmission distance (D) to surface undulation wavelength (λs) of roughly less than 2. This is because the method is based on a quartic phase function approximation. In this paper, this limitation is resolved through this method's generalization, which is achieved by incorporating a technique for calculating the diffraction integral with a higher-degree phase function by using the steepest descent technique with a procedure for systematically identifying the active saddles of the phase function. Numerical examples demonstrate that the proposed asymptotic method can attain calculation accuracy comparable with the physical optics method, even in the case of large D/λs values.
URL: https://global.ieice.org/en_transactions/communications/10.1587/transcom.E95.B.3206/_p
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@ARTICLE{e95-b_10_3206,
author={Toshio IHARA, Kenji SEKI, },
journal={IEICE TRANSACTIONS on Communications},
title={Asymptotic Calculation of the Intensity of Millimeter Wave Propagation over an Undulating Surface Using the Diffraction Integral with a High-Degree Phase Function},
year={2012},
volume={E95-B},
number={10},
pages={3206-3214},
abstract={This paper proposes an asymptotic method for calculating the received intensity of multi-path millimeter waves transmitted over an undulating surface. This method is a generalization of the asymptotic method that the authors previously derived, based on a quartic phase function approximation, from the physical optics integral expression of the received intensity. The applicability of the previous method is limited to ratios of transmission distance (D) to surface undulation wavelength (λs) of roughly less than 2. This is because the method is based on a quartic phase function approximation. In this paper, this limitation is resolved through this method's generalization, which is achieved by incorporating a technique for calculating the diffraction integral with a higher-degree phase function by using the steepest descent technique with a procedure for systematically identifying the active saddles of the phase function. Numerical examples demonstrate that the proposed asymptotic method can attain calculation accuracy comparable with the physical optics method, even in the case of large D/λs values.},
keywords={},
doi={10.1587/transcom.E95.B.3206},
ISSN={1745-1345},
month={October},}
Copy
TY - JOUR
TI - Asymptotic Calculation of the Intensity of Millimeter Wave Propagation over an Undulating Surface Using the Diffraction Integral with a High-Degree Phase Function
T2 - IEICE TRANSACTIONS on Communications
SP - 3206
EP - 3214
AU - Toshio IHARA
AU - Kenji SEKI
PY - 2012
DO - 10.1587/transcom.E95.B.3206
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E95-B
IS - 10
JA - IEICE TRANSACTIONS on Communications
Y1 - October 2012
AB - This paper proposes an asymptotic method for calculating the received intensity of multi-path millimeter waves transmitted over an undulating surface. This method is a generalization of the asymptotic method that the authors previously derived, based on a quartic phase function approximation, from the physical optics integral expression of the received intensity. The applicability of the previous method is limited to ratios of transmission distance (D) to surface undulation wavelength (λs) of roughly less than 2. This is because the method is based on a quartic phase function approximation. In this paper, this limitation is resolved through this method's generalization, which is achieved by incorporating a technique for calculating the diffraction integral with a higher-degree phase function by using the steepest descent technique with a procedure for systematically identifying the active saddles of the phase function. Numerical examples demonstrate that the proposed asymptotic method can attain calculation accuracy comparable with the physical optics method, even in the case of large D/λs values.
ER -
English
