IEICE TRANSACTIONS on Electronics
Microwave Power Dependence Measurement of Surface Resistance of Superconducting Films Using a Dielectric Resonator Method with Circle Fit and Two-Mode Techniques
Summary :
A system was developed to measure the microwave power dependence of the surface resistance superconductor films. The system uses a dielectric resonator method combined with a circle fit technique and a two-mode technique to measure the microwave surface resistance of superconductor films. For validation, this system was used to measure such surface resistance for superconductor films with different surface morphologies. Significant difference in microwave power dependence of surface resistance was observed. This measurement system proved suitable for evaluating superconducting films for passive microwave devices, including high power devices such as transmitting filters.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E89-C No.2 pp.125-131
- Publication Date
- 2006/02/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1093/ietele/e89-c.2.125
- Type of Manuscript
- Special Section PAPER (Special Section on Superconducting High-frequency Devices)
- Category
Authors
Keyword
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Haruhiko OBARA, Shin KOSAKA, "Microwave Power Dependence Measurement of Surface Resistance of Superconducting Films Using a Dielectric Resonator Method with Circle Fit and Two-Mode Techniques" in IEICE TRANSACTIONS on Electronics,
vol. E89-C, no. 2, pp. 125-131, February 2006, doi: 10.1093/ietele/e89-c.2.125.
Abstract: A system was developed to measure the microwave power dependence of the surface resistance superconductor films. The system uses a dielectric resonator method combined with a circle fit technique and a two-mode technique to measure the microwave surface resistance of superconductor films. For validation, this system was used to measure such surface resistance for superconductor films with different surface morphologies. Significant difference in microwave power dependence of surface resistance was observed. This measurement system proved suitable for evaluating superconducting films for passive microwave devices, including high power devices such as transmitting filters.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e89-c.2.125/_p
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@ARTICLE{e89-c_2_125,
author={Haruhiko OBARA, Shin KOSAKA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Microwave Power Dependence Measurement of Surface Resistance of Superconducting Films Using a Dielectric Resonator Method with Circle Fit and Two-Mode Techniques},
year={2006},
volume={E89-C},
number={2},
pages={125-131},
abstract={A system was developed to measure the microwave power dependence of the surface resistance superconductor films. The system uses a dielectric resonator method combined with a circle fit technique and a two-mode technique to measure the microwave surface resistance of superconductor films. For validation, this system was used to measure such surface resistance for superconductor films with different surface morphologies. Significant difference in microwave power dependence of surface resistance was observed. This measurement system proved suitable for evaluating superconducting films for passive microwave devices, including high power devices such as transmitting filters.},
keywords={},
doi={10.1093/ietele/e89-c.2.125},
ISSN={1745-1353},
month={February},}
Copy
TY - JOUR
TI - Microwave Power Dependence Measurement of Surface Resistance of Superconducting Films Using a Dielectric Resonator Method with Circle Fit and Two-Mode Techniques
T2 - IEICE TRANSACTIONS on Electronics
SP - 125
EP - 131
AU - Haruhiko OBARA
AU - Shin KOSAKA
PY - 2006
DO - 10.1093/ietele/e89-c.2.125
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E89-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2006
AB - A system was developed to measure the microwave power dependence of the surface resistance superconductor films. The system uses a dielectric resonator method combined with a circle fit technique and a two-mode technique to measure the microwave surface resistance of superconductor films. For validation, this system was used to measure such surface resistance for superconductor films with different surface morphologies. Significant difference in microwave power dependence of surface resistance was observed. This measurement system proved suitable for evaluating superconducting films for passive microwave devices, including high power devices such as transmitting filters.
ER -
English
