On the Performance of Multivalued Integrated Circuits: Past, Present and Future
Summary :
We examine the characteristics of the past successful m-valued I2L and ROMs that have been designed and we discuss the reasons of their success and withdraw. We look at the problems associated with scaling of m-valued CMOS current mode circuits. Then we discuss the tolerance issue, the respective propagation delays of binary and m-valued ICs and the interconnection issue. We conclude with the challenges for m-valued circuits in the competition with the exponential performance increase of binary circuits.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E76-C No.3 pp.364-371
- Publication Date
- 1993/03/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section INVITED PAPER (Special Issue on Multiple-Valued Integrated Circuits)
- Category
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Daniel ETIEMBLE, "On the Performance of Multivalued Integrated Circuits: Past, Present and Future" in IEICE TRANSACTIONS on Electronics,
vol. E76-C, no. 3, pp. 364-371, March 1993, doi: .
Abstract: We examine the characteristics of the past successful m-valued I2L and ROMs that have been designed and we discuss the reasons of their success and withdraw. We look at the problems associated with scaling of m-valued CMOS current mode circuits. Then we discuss the tolerance issue, the respective propagation delays of binary and m-valued ICs and the interconnection issue. We conclude with the challenges for m-valued circuits in the competition with the exponential performance increase of binary circuits.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e76-c_3_364/_p
Copy
@ARTICLE{e76-c_3_364,
author={Daniel ETIEMBLE, },
journal={IEICE TRANSACTIONS on Electronics},
title={On the Performance of Multivalued Integrated Circuits: Past, Present and Future},
year={1993},
volume={E76-C},
number={3},
pages={364-371},
abstract={We examine the characteristics of the past successful m-valued I2L and ROMs that have been designed and we discuss the reasons of their success and withdraw. We look at the problems associated with scaling of m-valued CMOS current mode circuits. Then we discuss the tolerance issue, the respective propagation delays of binary and m-valued ICs and the interconnection issue. We conclude with the challenges for m-valued circuits in the competition with the exponential performance increase of binary circuits.},
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - On the Performance of Multivalued Integrated Circuits: Past, Present and Future
T2 - IEICE TRANSACTIONS on Electronics
SP - 364
EP - 371
AU - Daniel ETIEMBLE
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E76-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 1993
AB - We examine the characteristics of the past successful m-valued I2L and ROMs that have been designed and we discuss the reasons of their success and withdraw. We look at the problems associated with scaling of m-valued CMOS current mode circuits. Then we discuss the tolerance issue, the respective propagation delays of binary and m-valued ICs and the interconnection issue. We conclude with the challenges for m-valued circuits in the competition with the exponential performance increase of binary circuits.
ER -
English
