Analysis of Nonohmic Piezoelectric Resonator Contacts

Noboru WAKATSUKI; Masaaki ONO; Kenji FUKAYAMA; Masanori YACHI

Analysis of Nonohmic Piezoelectric Resonator Contacts

Noboru WAKATSUKI, Masaaki ONO, Kenji FUKAYAMA, Masanori YACHI

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Single-crystal LiNbO₃ and LiTaO₃ piezo-electric resonators were developed for surface-mount technology (SMT) used in electronic equipment manufacturing. Using an energy-trapping design, a shear-mode piezoelectric resonator chip is bonded directly to the board with conductive resin and covered with a ceramic cap. The process occasionally produces nonlinear resonators, however, which led us to study the frequency characteristics of impedances for the abnormal samples. Their input impedances at the resonant frequency depended on the driving voltage. The insulator between the thin film metal electrode on the crystal strip or the thick film electrode on the ceramic base, in conjunction with silver balls in the adhesive resin, apparently caused the problem. Assuming that the insulator makes diode contacts, which show stable nonohmic phenonena or cause a discharge in a conductor causing a drastically changing in the impedance, we proposed the following corrective action：subject the nonohmic contacts to a high-voltage frequency-swept signal near the resonant frequency. The samples subjected to the high voltages recovered metalic contact and maintained even after severe thermal cycle testing.

Publication: IEICE TRANSACTIONS on Electronics Vol.E77-C No.10 pp.1587-1591

Publication Date: 1994/10/25

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Type of Manuscript: Special Section PAPER (Special Issue on Recent Electromechanical Devices)

Category: Actuator and Resonator

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Noboru WAKATSUKI, Masaaki ONO, Kenji FUKAYAMA, Masanori YACHI, "Analysis of Nonohmic Piezoelectric Resonator Contacts" in IEICE TRANSACTIONS on Electronics, vol. E77-C, no. 10, pp. 1587-1591, October 1994, doi: .
Abstract: Single-crystal LiNbO₃ and LiTaO₃ piezo-electric resonators were developed for surface-mount technology (SMT) used in electronic equipment manufacturing. Using an energy-trapping design, a shear-mode piezoelectric resonator chip is bonded directly to the board with conductive resin and covered with a ceramic cap. The process occasionally produces nonlinear resonators, however, which led us to study the frequency characteristics of impedances for the abnormal samples. Their input impedances at the resonant frequency depended on the driving voltage. The insulator between the thin film metal electrode on the crystal strip or the thick film electrode on the ceramic base, in conjunction with silver balls in the adhesive resin, apparently caused the problem. Assuming that the insulator makes diode contacts, which show stable nonohmic phenonena or cause a discharge in a conductor causing a drastically changing in the impedance, we proposed the following corrective action：subject the nonohmic contacts to a high-voltage frequency-swept signal near the resonant frequency. The samples subjected to the high voltages recovered metalic contact and maintained even after severe thermal cycle testing.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e77-c_10_1587/_p

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@ARTICLE{e77-c_10_1587,
author={Noboru WAKATSUKI, Masaaki ONO, Kenji FUKAYAMA, Masanori YACHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis of Nonohmic Piezoelectric Resonator Contacts},
year={1994},
volume={E77-C},
number={10},
pages={1587-1591},
abstract={Single-crystal LiNbO₃ and LiTaO₃ piezo-electric resonators were developed for surface-mount technology (SMT) used in electronic equipment manufacturing. Using an energy-trapping design, a shear-mode piezoelectric resonator chip is bonded directly to the board with conductive resin and covered with a ceramic cap. The process occasionally produces nonlinear resonators, however, which led us to study the frequency characteristics of impedances for the abnormal samples. Their input impedances at the resonant frequency depended on the driving voltage. The insulator between the thin film metal electrode on the crystal strip or the thick film electrode on the ceramic base, in conjunction with silver balls in the adhesive resin, apparently caused the problem. Assuming that the insulator makes diode contacts, which show stable nonohmic phenonena or cause a discharge in a conductor causing a drastically changing in the impedance, we proposed the following corrective action：subject the nonohmic contacts to a high-voltage frequency-swept signal near the resonant frequency. The samples subjected to the high voltages recovered metalic contact and maintained even after severe thermal cycle testing.},
keywords={},
doi={},
ISSN={},
month={October},}

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TY - JOUR
TI - Analysis of Nonohmic Piezoelectric Resonator Contacts
T2 - IEICE TRANSACTIONS on Electronics
SP - 1587
EP - 1591
AU - Noboru WAKATSUKI
AU - Masaaki ONO
AU - Kenji FUKAYAMA
AU - Masanori YACHI
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 1994
AB - Single-crystal LiNbO₃ and LiTaO₃ piezo-electric resonators were developed for surface-mount technology (SMT) used in electronic equipment manufacturing. Using an energy-trapping design, a shear-mode piezoelectric resonator chip is bonded directly to the board with conductive resin and covered with a ceramic cap. The process occasionally produces nonlinear resonators, however, which led us to study the frequency characteristics of impedances for the abnormal samples. Their input impedances at the resonant frequency depended on the driving voltage. The insulator between the thin film metal electrode on the crystal strip or the thick film electrode on the ceramic base, in conjunction with silver balls in the adhesive resin, apparently caused the problem. Assuming that the insulator makes diode contacts, which show stable nonohmic phenonena or cause a discharge in a conductor causing a drastically changing in the impedance, we proposed the following corrective action：subject the nonohmic contacts to a high-voltage frequency-swept signal near the resonant frequency. The samples subjected to the high voltages recovered metalic contact and maintained even after severe thermal cycle testing.
ER -