Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method

Yoshinori KOGAMI; Yoshio KOBAYASHI; Masayuki KATOH

Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method

Yoshinori KOGAMI, Yoshio KOBAYASHI, Masayuki KATOH

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An image type resonator method is proposed as a method to evaluate precisely the temperature dependence of dielectric material. At first, the temperature coefficients of the resonant frequencies, TC_f are measured separately using the shielded dielectric resonators of three types; that is a parallel plate type, and an image type, and a MIC type resonator. Secondly, an intrinsic temperature coefficient of the resonant frequency TC_f0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric, is estimated from these measured TC_f. Actually, the TC_f0 values of a sapphire and (Zr・Sn) TiO₄ rod are estimated from the TC_f values measured for the resonators of three types. As a result, for the parallel plate type, the precision of TC_f0 is about 0.1 ppm/. For the image and MIC types, the errors of about 0.5 ppm/ in the TC_f0 values arise from the errors in the linear expansion coefficients of the resonators, rather than from the experimental errors in TC_f. Then, another image type resonator is designed to estimate TC_f0 within error of 0.1 ppm/. In this design, dimensions of the shielding cavity is determined to reduce the influence of the errors in the linear expansion coefficients on precision of the TC_f0 estimation. Finally, for a (Zr・Sn) TiO₄ ceramic rod, a TC_f0 value estimated from TC_f measured for the image type resonator is obtained with accuracy of about0.1 ppm/.

Publication: IEICE TRANSACTIONS on Electronics Vol.E77-C No.6 pp.888-893

Publication Date: 1994/06/25

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Type of Manuscript: Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)

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Yoshinori KOGAMI, Yoshio KOBAYASHI, Masayuki KATOH, "Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method" in IEICE TRANSACTIONS on Electronics, vol. E77-C, no. 6, pp. 888-893, June 1994, doi: .
Abstract: An image type resonator method is proposed as a method to evaluate precisely the temperature dependence of dielectric material. At first, the temperature coefficients of the resonant frequencies, TC_f are measured separately using the shielded dielectric resonators of three types; that is a parallel plate type, and an image type, and a MIC type resonator. Secondly, an intrinsic temperature coefficient of the resonant frequency TC_f0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric, is estimated from these measured TC_f. Actually, the TC_f0 values of a sapphire and (Zr・Sn) TiO₄ rod are estimated from the TC_f values measured for the resonators of three types. As a result, for the parallel plate type, the precision of TC_f0 is about 0.1 ppm/. For the image and MIC types, the errors of about 0.5 ppm/ in the TC_f0 values arise from the errors in the linear expansion coefficients of the resonators, rather than from the experimental errors in TC_f. Then, another image type resonator is designed to estimate TC_f0 within error of 0.1 ppm/. In this design, dimensions of the shielding cavity is determined to reduce the influence of the errors in the linear expansion coefficients on precision of the TC_f0 estimation. Finally, for a (Zr・Sn) TiO₄ ceramic rod, a TC_f0 value estimated from TC_f measured for the image type resonator is obtained with accuracy of about0.1 ppm/.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e77-c_6_888/_p

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@ARTICLE{e77-c_6_888,
author={Yoshinori KOGAMI, Yoshio KOBAYASHI, Masayuki KATOH, },
journal={IEICE TRANSACTIONS on Electronics},
title={Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method},
year={1994},
volume={E77-C},
number={6},
pages={888-893},
abstract={An image type resonator method is proposed as a method to evaluate precisely the temperature dependence of dielectric material. At first, the temperature coefficients of the resonant frequencies, TC_f are measured separately using the shielded dielectric resonators of three types; that is a parallel plate type, and an image type, and a MIC type resonator. Secondly, an intrinsic temperature coefficient of the resonant frequency TC_f0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric, is estimated from these measured TC_f. Actually, the TC_f0 values of a sapphire and (Zr・Sn) TiO₄ rod are estimated from the TC_f values measured for the resonators of three types. As a result, for the parallel plate type, the precision of TC_f0 is about 0.1 ppm/. For the image and MIC types, the errors of about 0.5 ppm/ in the TC_f0 values arise from the errors in the linear expansion coefficients of the resonators, rather than from the experimental errors in TC_f. Then, another image type resonator is designed to estimate TC_f0 within error of 0.1 ppm/. In this design, dimensions of the shielding cavity is determined to reduce the influence of the errors in the linear expansion coefficients on precision of the TC_f0 estimation. Finally, for a (Zr・Sn) TiO₄ ceramic rod, a TC_f0 value estimated from TC_f measured for the image type resonator is obtained with accuracy of about0.1 ppm/.},
keywords={},
doi={},
ISSN={},
month={June},}

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TY - JOUR
TI - Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method
T2 - IEICE TRANSACTIONS on Electronics
SP - 888
EP - 893
AU - Yoshinori KOGAMI
AU - Yoshio KOBAYASHI
AU - Masayuki KATOH
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1994
AB - An image type resonator method is proposed as a method to evaluate precisely the temperature dependence of dielectric material. At first, the temperature coefficients of the resonant frequencies, TC_f are measured separately using the shielded dielectric resonators of three types; that is a parallel plate type, and an image type, and a MIC type resonator. Secondly, an intrinsic temperature coefficient of the resonant frequency TC_f0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric, is estimated from these measured TC_f. Actually, the TC_f0 values of a sapphire and (Zr・Sn) TiO₄ rod are estimated from the TC_f values measured for the resonators of three types. As a result, for the parallel plate type, the precision of TC_f0 is about 0.1 ppm/. For the image and MIC types, the errors of about 0.5 ppm/ in the TC_f0 values arise from the errors in the linear expansion coefficients of the resonators, rather than from the experimental errors in TC_f. Then, another image type resonator is designed to estimate TC_f0 within error of 0.1 ppm/. In this design, dimensions of the shielding cavity is determined to reduce the influence of the errors in the linear expansion coefficients on precision of the TC_f0 estimation. Finally, for a (Zr・Sn) TiO₄ ceramic rod, a TC_f0 value estimated from TC_f measured for the image type resonator is obtained with accuracy of about0.1 ppm/.
ER -