IEICE TRANSACTIONS on Electronics
A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics
Summary :
A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E77-C No.6 pp.908-912
- Publication Date
- 1994/06/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
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Tatsuya OMORI, Ken'ichiro YASHIRO, Sumio OHKAWA, "A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics" in IEICE TRANSACTIONS on Electronics,
vol. E77-C, no. 6, pp. 908-912, June 1994, doi: .
Abstract: A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e77-c_6_908/_p
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@ARTICLE{e77-c_6_908,
author={Tatsuya OMORI, Ken'ichiro YASHIRO, Sumio OHKAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics},
year={1994},
volume={E77-C},
number={6},
pages={908-912},
abstract={A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.},
keywords={},
doi={},
ISSN={},
month={June},}
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TY - JOUR
TI - A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics
T2 - IEICE TRANSACTIONS on Electronics
SP - 908
EP - 912
AU - Tatsuya OMORI
AU - Ken'ichiro YASHIRO
AU - Sumio OHKAWA
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1994
AB - A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.
ER -
English
