Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures

Toshifumi OHKUBO; Yasushi MAEDA; Yasuhiro KOSHIMOTO

Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures

Toshifumi OHKUBO, Yasushi MAEDA, Yasuhiro KOSHIMOTO

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A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm). and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.

Publication: IEICE TRANSACTIONS on Electronics Vol.E78-C No.11 pp.1523-1529

Publication Date: 1995/11/25

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Type of Manuscript: Special Section PAPER (Special Issue on Ultra High Density Information Storage Technologies)

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Toshifumi OHKUBO, Yasushi MAEDA, Yasuhiro KOSHIMOTO, "Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures" in IEICE TRANSACTIONS on Electronics, vol. E78-C, no. 11, pp. 1523-1529, November 1995, doi: .
Abstract: A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm). and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e78-c_11_1523/_p

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@ARTICLE{e78-c_11_1523,
author={Toshifumi OHKUBO, Yasushi MAEDA, Yasuhiro KOSHIMOTO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures},
year={1995},
volume={E78-C},
number={11},
pages={1523-1529},
abstract={A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm). and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.},
keywords={},
doi={},
ISSN={},
month={November},}

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TY - JOUR
TI - Point Magnetic Recording Using a Force Microscope Tip on Co-Cr Perpendicular Media with Compositionally Separated Microstructures
T2 - IEICE TRANSACTIONS on Electronics
SP - 1523
EP - 1529
AU - Toshifumi OHKUBO
AU - Yasushi MAEDA
AU - Yasuhiro KOSHIMOTO
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E78-C
IS - 11
JA - IEICE TRANSACTIONS on Electronics
Y1 - November 1995
AB - A soft magnetic force microscope (MFM) tip was used to evaluate the magnetic recording characteristics of compositionally separated Co-Cr perpendicular media. Small magnetic bits were recorded on thick (350 nm). and thin (100 nm) films, focusing on the fineness of compositionally separated microstructures. MFM images showed bit marks 230 and 150 nm in diameter, measured at full-width at half maximum (FWHM) for the thick and thin films, respectively. These results verify that the recordable bit size can be decreased by using a thinner film with a finer compositionally separated microstructure. Simulation was used to clarify the relationship between the actual sizes of the recorded bits and the sizes of their MFM images. The recorded bit size was found to closely correspond to the FWHM of the MFM bit images.
ER -