Scanning Force Microscope Using Piezoelectric Excitation and Detection

Toshihiro ITOH; Takahiro OHASHI; Tadatomo SUGA

Scanning Force Microscope Using Piezoelectric Excitation and Detection

Toshihiro ITOH, Takahiro OHASHI, Tadatomo SUGA

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This paper reports on a new dynamic scanning force microscope (SFM), in which the piezoelectric microcantilever is utilized for the lever excitation and displacement sensing. Piezoelectric cantilevers can detect their deflection without external sensing elements and be vibrated with no oscillator outside. The cantilever integrated with the deflection detector and the oscillator changes the conventional construction of a dynamic SFM and expands its range of applicability. The microcantilever used consists of a ZnO layer sandwiched with Au electrodes deposited on a thin beam of thermally grown SiO₂. The length, width and thickness of the lever are 125 µm, 50 µm and 3.5 µm, respectively. We have characterized this cantilever by measuring the charge spectrum and the frequency dependence of the admittance. From the charge spectrum the mechanical quality factor measured 300 in free vibration. Typical piezoelectric constant of the ZnO film was estimated approximately as 80% of single-crystal's value. The piezoelectric cantilever can be vibrated by applying the voltage with the frequency near the resonance to the piezoelectric layer. The excited amplitude per unit voltage at the resonance frequency was calculated as about 5 µm/V. The cantilever amplitude can be detected by measuring the current between electrodes, since the admittance depends on the quality factor. We have constructed a dynamic SFM without external oscillator and detector, and successfully obtained the surface images of a sol-gel derived PZT film in the cyclic contact operation mode. The longitudinal resolution of the SFM system was 0.3 nm at a 125 Hz bandwidth.

Publication: IEICE TRANSACTIONS on Electronics Vol.E78-C No.2 pp.146-151

Publication Date: 1995/02/25

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Type of Manuscript: Special Section PAPER (Special Issue on Micromachines and Micro Electro Mechanical Systems)

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Toshihiro ITOH, Takahiro OHASHI, Tadatomo SUGA, "Scanning Force Microscope Using Piezoelectric Excitation and Detection" in IEICE TRANSACTIONS on Electronics, vol. E78-C, no. 2, pp. 146-151, February 1995, doi: .
Abstract: This paper reports on a new dynamic scanning force microscope (SFM), in which the piezoelectric microcantilever is utilized for the lever excitation and displacement sensing. Piezoelectric cantilevers can detect their deflection without external sensing elements and be vibrated with no oscillator outside. The cantilever integrated with the deflection detector and the oscillator changes the conventional construction of a dynamic SFM and expands its range of applicability. The microcantilever used consists of a ZnO layer sandwiched with Au electrodes deposited on a thin beam of thermally grown SiO₂. The length, width and thickness of the lever are 125 µm, 50 µm and 3.5 µm, respectively. We have characterized this cantilever by measuring the charge spectrum and the frequency dependence of the admittance. From the charge spectrum the mechanical quality factor measured 300 in free vibration. Typical piezoelectric constant of the ZnO film was estimated approximately as 80% of single-crystal's value. The piezoelectric cantilever can be vibrated by applying the voltage with the frequency near the resonance to the piezoelectric layer. The excited amplitude per unit voltage at the resonance frequency was calculated as about 5 µm/V. The cantilever amplitude can be detected by measuring the current between electrodes, since the admittance depends on the quality factor. We have constructed a dynamic SFM without external oscillator and detector, and successfully obtained the surface images of a sol-gel derived PZT film in the cyclic contact operation mode. The longitudinal resolution of the SFM system was 0.3 nm at a 125 Hz bandwidth.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e78-c_2_146/_p

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@ARTICLE{e78-c_2_146,
author={Toshihiro ITOH, Takahiro OHASHI, Tadatomo SUGA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Scanning Force Microscope Using Piezoelectric Excitation and Detection},
year={1995},
volume={E78-C},
number={2},
pages={146-151},
abstract={This paper reports on a new dynamic scanning force microscope (SFM), in which the piezoelectric microcantilever is utilized for the lever excitation and displacement sensing. Piezoelectric cantilevers can detect their deflection without external sensing elements and be vibrated with no oscillator outside. The cantilever integrated with the deflection detector and the oscillator changes the conventional construction of a dynamic SFM and expands its range of applicability. The microcantilever used consists of a ZnO layer sandwiched with Au electrodes deposited on a thin beam of thermally grown SiO₂. The length, width and thickness of the lever are 125 µm, 50 µm and 3.5 µm, respectively. We have characterized this cantilever by measuring the charge spectrum and the frequency dependence of the admittance. From the charge spectrum the mechanical quality factor measured 300 in free vibration. Typical piezoelectric constant of the ZnO film was estimated approximately as 80% of single-crystal's value. The piezoelectric cantilever can be vibrated by applying the voltage with the frequency near the resonance to the piezoelectric layer. The excited amplitude per unit voltage at the resonance frequency was calculated as about 5 µm/V. The cantilever amplitude can be detected by measuring the current between electrodes, since the admittance depends on the quality factor. We have constructed a dynamic SFM without external oscillator and detector, and successfully obtained the surface images of a sol-gel derived PZT film in the cyclic contact operation mode. The longitudinal resolution of the SFM system was 0.3 nm at a 125 Hz bandwidth.},
keywords={},
doi={},
ISSN={},
month={February},}

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TY - JOUR
TI - Scanning Force Microscope Using Piezoelectric Excitation and Detection
T2 - IEICE TRANSACTIONS on Electronics
SP - 146
EP - 151
AU - Toshihiro ITOH
AU - Takahiro OHASHI
AU - Tadatomo SUGA
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E78-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 1995
AB - This paper reports on a new dynamic scanning force microscope (SFM), in which the piezoelectric microcantilever is utilized for the lever excitation and displacement sensing. Piezoelectric cantilevers can detect their deflection without external sensing elements and be vibrated with no oscillator outside. The cantilever integrated with the deflection detector and the oscillator changes the conventional construction of a dynamic SFM and expands its range of applicability. The microcantilever used consists of a ZnO layer sandwiched with Au electrodes deposited on a thin beam of thermally grown SiO₂. The length, width and thickness of the lever are 125 µm, 50 µm and 3.5 µm, respectively. We have characterized this cantilever by measuring the charge spectrum and the frequency dependence of the admittance. From the charge spectrum the mechanical quality factor measured 300 in free vibration. Typical piezoelectric constant of the ZnO film was estimated approximately as 80% of single-crystal's value. The piezoelectric cantilever can be vibrated by applying the voltage with the frequency near the resonance to the piezoelectric layer. The excited amplitude per unit voltage at the resonance frequency was calculated as about 5 µm/V. The cantilever amplitude can be detected by measuring the current between electrodes, since the admittance depends on the quality factor. We have constructed a dynamic SFM without external oscillator and detector, and successfully obtained the surface images of a sol-gel derived PZT film in the cyclic contact operation mode. The longitudinal resolution of the SFM system was 0.3 nm at a 125 Hz bandwidth.
ER -