A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique
Summary :
This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E81-C No.12 pp.1936-1941
- Publication Date
- 1998/12/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Category
- Microwave and Millimeter Wave Technology
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Zhihong MA, Seichi OKAMURA, "A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 12, pp. 1936-1941, December 1998, doi: .
Abstract: This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_12_1936/_p
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@ARTICLE{e81-c_12_1936,
author={Zhihong MA, Seichi OKAMURA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique},
year={1998},
volume={E81-C},
number={12},
pages={1936-1941},
abstract={This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique
T2 - IEICE TRANSACTIONS on Electronics
SP - 1936
EP - 1941
AU - Zhihong MA
AU - Seichi OKAMURA
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 1998
AB - This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.
ER -
English
