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This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.

- Publication
- IEICE TRANSACTIONS on Electronics Vol.E81-C No.12 pp.1936-1941

- Publication Date
- 1998/12/25

- Publicized

- Online ISSN

- DOI

- Type of Manuscript

- Category
- Microwave and Millimeter Wave Technology

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Zhihong MA, Seichi OKAMURA, "A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 12, pp. 1936-1941, December 1998, doi: .

Abstract: This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.

URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_12_1936/_p

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@ARTICLE{e81-c_12_1936,

author={Zhihong MA, Seichi OKAMURA, },

journal={IEICE TRANSACTIONS on Electronics},

title={A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique},

year={1998},

volume={E81-C},

number={12},

pages={1936-1941},

abstract={This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.},

keywords={},

doi={},

ISSN={},

month={December},}

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TY - JOUR

TI - A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique

T2 - IEICE TRANSACTIONS on Electronics

SP - 1936

EP - 1941

AU - Zhihong MA

AU - Seichi OKAMURA

PY - 1998

DO -

JO - IEICE TRANSACTIONS on Electronics

SN -

VL - E81-C

IS - 12

JA - IEICE TRANSACTIONS on Electronics

Y1 - December 1998

AB - This paper describes a new method for permittivity measurement using microwave free-space technique. The general consideration is to measure the amplitudes of transmission and reflection coefficients and calculate the permittivity from the measurement values. Theoretical analysis shows that the permittivity of the sample can be calculated solely from the measurement values of the amplitudes of transmission and reflection coefficients when the sample is prepared with so large attenuation that the multiple reflections between the two surfaces of the sample can be neglected. Using this method, the permittivity measurement can be performed without reflection influence, and on-line measurement of the permittivity becomes possible because the permittivity can be measured instantaneously and without contact with the material.

ER -