Improvement of Operation Reliability at Room Temperature for a Single Electron Pump

Kouichirou YAMAMURA; Yoshiyuki SUDA

Improvement of Operation Reliability at Room Temperature for a Single Electron Pump

Kouichirou YAMAMURA, Yoshiyuki SUDA

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We have studied the methods to operate single electron circuits with high reliability at room temperature. By simulation, we have numerically analyzed the error mechanisms of the room-temperature operation of a 2-gate electron pump as a fundamental single electron element circuit. We have found from the results that under the room temperature condition where the ratio of the electrostatic energy to the thermal energy for a transition electron is not so large, the minimum operation error probability is obtained at the specific gate sweep time when the circuit is operated with ramp-waveform control voltages. The analyses indicate that in the shorter sweep time range, the error probability increases because the gate voltage has changed before the significant electron transition occurs, and that in the longer sweep time range, the error probability also increases due to undesired-single-transition events. The optimum sweep time is estimated statically with the relationship between desired- and undesired-single-transition rates as a function of control gate voltages. Using the optimum condition, the operation reliability is expected to be improved by a factor of 100. This estimation method has been also confirmed by the time-dependent Monte-Carlo simulation.

Publication: IEICE TRANSACTIONS on Electronics Vol.E81-C No.1 pp.16-20

Publication Date: 1998/01/25

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Type of Manuscript: Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices)

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Kouichirou YAMAMURA, Yoshiyuki SUDA, "Improvement of Operation Reliability at Room Temperature for a Single Electron Pump" in IEICE TRANSACTIONS on Electronics, vol. E81-C, no. 1, pp. 16-20, January 1998, doi: .
Abstract: We have studied the methods to operate single electron circuits with high reliability at room temperature. By simulation, we have numerically analyzed the error mechanisms of the room-temperature operation of a 2-gate electron pump as a fundamental single electron element circuit. We have found from the results that under the room temperature condition where the ratio of the electrostatic energy to the thermal energy for a transition electron is not so large, the minimum operation error probability is obtained at the specific gate sweep time when the circuit is operated with ramp-waveform control voltages. The analyses indicate that in the shorter sweep time range, the error probability increases because the gate voltage has changed before the significant electron transition occurs, and that in the longer sweep time range, the error probability also increases due to undesired-single-transition events. The optimum sweep time is estimated statically with the relationship between desired- and undesired-single-transition rates as a function of control gate voltages. Using the optimum condition, the operation reliability is expected to be improved by a factor of 100. This estimation method has been also confirmed by the time-dependent Monte-Carlo simulation.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_1_16/_p

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@ARTICLE{e81-c_1_16,
author={Kouichirou YAMAMURA, Yoshiyuki SUDA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Improvement of Operation Reliability at Room Temperature for a Single Electron Pump},
year={1998},
volume={E81-C},
number={1},
pages={16-20},
abstract={We have studied the methods to operate single electron circuits with high reliability at room temperature. By simulation, we have numerically analyzed the error mechanisms of the room-temperature operation of a 2-gate electron pump as a fundamental single electron element circuit. We have found from the results that under the room temperature condition where the ratio of the electrostatic energy to the thermal energy for a transition electron is not so large, the minimum operation error probability is obtained at the specific gate sweep time when the circuit is operated with ramp-waveform control voltages. The analyses indicate that in the shorter sweep time range, the error probability increases because the gate voltage has changed before the significant electron transition occurs, and that in the longer sweep time range, the error probability also increases due to undesired-single-transition events. The optimum sweep time is estimated statically with the relationship between desired- and undesired-single-transition rates as a function of control gate voltages. Using the optimum condition, the operation reliability is expected to be improved by a factor of 100. This estimation method has been also confirmed by the time-dependent Monte-Carlo simulation.},
keywords={},
doi={},
ISSN={},
month={January},}

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TY - JOUR
TI - Improvement of Operation Reliability at Room Temperature for a Single Electron Pump
T2 - IEICE TRANSACTIONS on Electronics
SP - 16
EP - 20
AU - Kouichirou YAMAMURA
AU - Yoshiyuki SUDA
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1998
AB - We have studied the methods to operate single electron circuits with high reliability at room temperature. By simulation, we have numerically analyzed the error mechanisms of the room-temperature operation of a 2-gate electron pump as a fundamental single electron element circuit. We have found from the results that under the room temperature condition where the ratio of the electrostatic energy to the thermal energy for a transition electron is not so large, the minimum operation error probability is obtained at the specific gate sweep time when the circuit is operated with ramp-waveform control voltages. The analyses indicate that in the shorter sweep time range, the error probability increases because the gate voltage has changed before the significant electron transition occurs, and that in the longer sweep time range, the error probability also increases due to undesired-single-transition events. The optimum sweep time is estimated statically with the relationship between desired- and undesired-single-transition rates as a function of control gate voltages. Using the optimum condition, the operation reliability is expected to be improved by a factor of 100. This estimation method has been also confirmed by the time-dependent Monte-Carlo simulation.
ER -