A High-Resolution Measurement System for Surface Profile of Electric Contact

Yasuo EBARA; Hideaki SONE; Yoshiaki NEMOTO; Tasuku TAKAGI

A High-Resolution Measurement System for Surface Profile of Electric Contact

Yasuo EBARA, Hideaki SONE, Yoshiaki NEMOTO, Tasuku TAKAGI

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We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [µm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.

Publication: IEICE TRANSACTIONS on Electronics Vol.E81-C No.3 pp.432-434

Publication Date: 1998/03/25

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Type of Manuscript: Special Section LETTER (Special Issue on Electromechanical Devices and their Surface Science)

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Yasuo EBARA, Hideaki SONE, Yoshiaki NEMOTO, Tasuku TAKAGI, "A High-Resolution Measurement System for Surface Profile of Electric Contact" in IEICE TRANSACTIONS on Electronics, vol. E81-C, no. 3, pp. 432-434, March 1998, doi: .
Abstract: We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [µm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_3_432/_p

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@ARTICLE{e81-c_3_432,
author={Yasuo EBARA, Hideaki SONE, Yoshiaki NEMOTO, Tasuku TAKAGI, },
journal={IEICE TRANSACTIONS on Electronics},
title={A High-Resolution Measurement System for Surface Profile of Electric Contact},
year={1998},
volume={E81-C},
number={3},
pages={432-434},
abstract={We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [µm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.},
keywords={},
doi={},
ISSN={},
month={March},}

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TY - JOUR
TI - A High-Resolution Measurement System for Surface Profile of Electric Contact
T2 - IEICE TRANSACTIONS on Electronics
SP - 432
EP - 434
AU - Yasuo EBARA
AU - Hideaki SONE
AU - Yoshiaki NEMOTO
AU - Tasuku TAKAGI
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 1998
AB - We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [µm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.
ER -