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IEICE TRANSACTIONS on Electronics

A Plausible Mechanism for Electromagnetic Interference in the Arc Transition

Zhuan-Ke CHEN, Toshiro HAYAKAWA, Koichiro SAWA

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Summary :

The electromagnetic interference (EMI) induced by steady arc has been demonstrated to be dependent on arc voltage fluctuation when the arc transfers from the metallic phase to the gaseous phase. In order to give the physical understanding of this arc voltage fluctuation and EMI, several typical materials, such as Ag, Cu and Zr, were tested and their arc behavior was determined and compared. The experimental results indicated that the arc behavior, in particular the arc voltage fluctuation in the moment that metallic phase transfers to the gaseous phase was different for different materials. Based on the test results and former investigations, a plausible mechanism is proposed for understanding these phenomena.

Publication
IEICE TRANSACTIONS on Electronics Vol.E81-C No.3 pp.435-438
Publication Date
1998/03/25
Publicized
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DOI
Type of Manuscript
Special Section LETTER (Special Issue on Electromechanical Devices and their Surface Science)
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