The electromagnetic interference (EMI) induced by steady arc has been demonstrated to be dependent on arc voltage fluctuation when the arc transfers from the metallic phase to the gaseous phase. In order to give the physical understanding of this arc voltage fluctuation and EMI, several typical materials, such as Ag, Cu and Zr, were tested and their arc behavior was determined and compared. The experimental results indicated that the arc behavior, in particular the arc voltage fluctuation in the moment that metallic phase transfers to the gaseous phase was different for different materials. Based on the test results and former investigations, a plausible mechanism is proposed for understanding these phenomena.
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Zhuan-Ke CHEN, Toshiro HAYAKAWA, Koichiro SAWA, "A Plausible Mechanism for Electromagnetic Interference in the Arc Transition" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 3, pp. 435-438, March 1998, doi: .
Abstract: The electromagnetic interference (EMI) induced by steady arc has been demonstrated to be dependent on arc voltage fluctuation when the arc transfers from the metallic phase to the gaseous phase. In order to give the physical understanding of this arc voltage fluctuation and EMI, several typical materials, such as Ag, Cu and Zr, were tested and their arc behavior was determined and compared. The experimental results indicated that the arc behavior, in particular the arc voltage fluctuation in the moment that metallic phase transfers to the gaseous phase was different for different materials. Based on the test results and former investigations, a plausible mechanism is proposed for understanding these phenomena.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_3_435/_p
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@ARTICLE{e81-c_3_435,
author={Zhuan-Ke CHEN, Toshiro HAYAKAWA, Koichiro SAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Plausible Mechanism for Electromagnetic Interference in the Arc Transition},
year={1998},
volume={E81-C},
number={3},
pages={435-438},
abstract={The electromagnetic interference (EMI) induced by steady arc has been demonstrated to be dependent on arc voltage fluctuation when the arc transfers from the metallic phase to the gaseous phase. In order to give the physical understanding of this arc voltage fluctuation and EMI, several typical materials, such as Ag, Cu and Zr, were tested and their arc behavior was determined and compared. The experimental results indicated that the arc behavior, in particular the arc voltage fluctuation in the moment that metallic phase transfers to the gaseous phase was different for different materials. Based on the test results and former investigations, a plausible mechanism is proposed for understanding these phenomena.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - A Plausible Mechanism for Electromagnetic Interference in the Arc Transition
T2 - IEICE TRANSACTIONS on Electronics
SP - 435
EP - 438
AU - Zhuan-Ke CHEN
AU - Toshiro HAYAKAWA
AU - Koichiro SAWA
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 1998
AB - The electromagnetic interference (EMI) induced by steady arc has been demonstrated to be dependent on arc voltage fluctuation when the arc transfers from the metallic phase to the gaseous phase. In order to give the physical understanding of this arc voltage fluctuation and EMI, several typical materials, such as Ag, Cu and Zr, were tested and their arc behavior was determined and compared. The experimental results indicated that the arc behavior, in particular the arc voltage fluctuation in the moment that metallic phase transfers to the gaseous phase was different for different materials. Based on the test results and former investigations, a plausible mechanism is proposed for understanding these phenomena.
ER -