A method for determination of the location, shape, and material properties of a 3D object from measurements of the scattered field, when the object is successively illuminated by a number of incident fields is presented. This work extends the method previously developed for reconstructions of 2D permittivity and conductivity from electromagnetic measurements to the more complicated full-vector 3D electromagnetic inversion. Furthermore, a frequency hopping strategy to improve the resolution of the unknown objects when the frequency is raised, is underlined. Results of numerical experiments are presented to illustrate both strengths and weaknesses of the method.
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Aria ABUBAKAR, Peter M. van den BERG, Bert Jan KOOIJ, "A Conjugate Gradient Contrast Source Technique for 3D Profile Inversion" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 12, pp. 1864-1874, December 2000, doi: .
Abstract: A method for determination of the location, shape, and material properties of a 3D object from measurements of the scattered field, when the object is successively illuminated by a number of incident fields is presented. This work extends the method previously developed for reconstructions of 2D permittivity and conductivity from electromagnetic measurements to the more complicated full-vector 3D electromagnetic inversion. Furthermore, a frequency hopping strategy to improve the resolution of the unknown objects when the frequency is raised, is underlined. Results of numerical experiments are presented to illustrate both strengths and weaknesses of the method.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_12_1864/_p
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@ARTICLE{e83-c_12_1864,
author={Aria ABUBAKAR, Peter M. van den BERG, Bert Jan KOOIJ, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Conjugate Gradient Contrast Source Technique for 3D Profile Inversion},
year={2000},
volume={E83-C},
number={12},
pages={1864-1874},
abstract={A method for determination of the location, shape, and material properties of a 3D object from measurements of the scattered field, when the object is successively illuminated by a number of incident fields is presented. This work extends the method previously developed for reconstructions of 2D permittivity and conductivity from electromagnetic measurements to the more complicated full-vector 3D electromagnetic inversion. Furthermore, a frequency hopping strategy to improve the resolution of the unknown objects when the frequency is raised, is underlined. Results of numerical experiments are presented to illustrate both strengths and weaknesses of the method.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - A Conjugate Gradient Contrast Source Technique for 3D Profile Inversion
T2 - IEICE TRANSACTIONS on Electronics
SP - 1864
EP - 1874
AU - Aria ABUBAKAR
AU - Peter M. van den BERG
AU - Bert Jan KOOIJ
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2000
AB - A method for determination of the location, shape, and material properties of a 3D object from measurements of the scattered field, when the object is successively illuminated by a number of incident fields is presented. This work extends the method previously developed for reconstructions of 2D permittivity and conductivity from electromagnetic measurements to the more complicated full-vector 3D electromagnetic inversion. Furthermore, a frequency hopping strategy to improve the resolution of the unknown objects when the frequency is raised, is underlined. Results of numerical experiments are presented to illustrate both strengths and weaknesses of the method.
ER -