Microstructure Analysis of Annealing Effect on CoCrPt Thin Film Media by XRD

Ding JIN; Ying SU; Jian Ping WANG; Hao GONG

Microstructure Analysis of Annealing Effect on CoCrPt Thin Film Media by XRD

Ding JIN, Ying SU, Jian Ping WANG, Hao GONG

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Post annealing treatment for CoCrPt magnetic thin films were tried in different thermal conditions, by changing the time of annealing procedure. Coercivity (H_c) improvement was achieved in annealed sample compared with those as deposited, in which as high as 5.2 kOe has been attained. To clarify the mechanism of annealing treatment on the magnetic properties, X-ray diffraction (XRD) spectrums of those samples and their magnetic properties were carefully studied. Co and Cr lattice parameters were separately calculated from different crystal lattice plane. It was found that a axis lattice spacing of Co hexagonal structure increases monotonically with increased annealing time. Variation of Co hcp peaks significance may due to Cr or Pt redistribution in the crystal grains and its boundaries. Combined with the grain size analysis of Co-rich area by X-ray diffraction peak broaden width, which was not very consistent with the result obtained from other's TEM and AFM studies, Cr diffusion was suggested to be the governing factor at short annealing time region. Co-rich grain growth should also be applied to explain the variation of magnetic properties in longer post annealing.

Publication: IEICE TRANSACTIONS on Electronics Vol.E83-C No.9 pp.1473-1477

Publication Date: 2000/09/25

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Type of Manuscript: Special Section PAPER (Special Issue on Selected Papers from the 4th Asian Symposium for Information Storage Technology)

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Ding JIN, Ying SU, Jian Ping WANG, Hao GONG, "Microstructure Analysis of Annealing Effect on CoCrPt Thin Film Media by XRD" in IEICE TRANSACTIONS on Electronics, vol. E83-C, no. 9, pp. 1473-1477, September 2000, doi: .
Abstract: Post annealing treatment for CoCrPt magnetic thin films were tried in different thermal conditions, by changing the time of annealing procedure. Coercivity (H_c) improvement was achieved in annealed sample compared with those as deposited, in which as high as 5.2 kOe has been attained. To clarify the mechanism of annealing treatment on the magnetic properties, X-ray diffraction (XRD) spectrums of those samples and their magnetic properties were carefully studied. Co and Cr lattice parameters were separately calculated from different crystal lattice plane. It was found that a axis lattice spacing of Co hexagonal structure increases monotonically with increased annealing time. Variation of Co hcp peaks significance may due to Cr or Pt redistribution in the crystal grains and its boundaries. Combined with the grain size analysis of Co-rich area by X-ray diffraction peak broaden width, which was not very consistent with the result obtained from other's TEM and AFM studies, Cr diffusion was suggested to be the governing factor at short annealing time region. Co-rich grain growth should also be applied to explain the variation of magnetic properties in longer post annealing.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_9_1473/_p

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@ARTICLE{e83-c_9_1473,
author={Ding JIN, Ying SU, Jian Ping WANG, Hao GONG, },
journal={IEICE TRANSACTIONS on Electronics},
title={Microstructure Analysis of Annealing Effect on CoCrPt Thin Film Media by XRD},
year={2000},
volume={E83-C},
number={9},
pages={1473-1477},
abstract={Post annealing treatment for CoCrPt magnetic thin films were tried in different thermal conditions, by changing the time of annealing procedure. Coercivity (H_c) improvement was achieved in annealed sample compared with those as deposited, in which as high as 5.2 kOe has been attained. To clarify the mechanism of annealing treatment on the magnetic properties, X-ray diffraction (XRD) spectrums of those samples and their magnetic properties were carefully studied. Co and Cr lattice parameters were separately calculated from different crystal lattice plane. It was found that a axis lattice spacing of Co hexagonal structure increases monotonically with increased annealing time. Variation of Co hcp peaks significance may due to Cr or Pt redistribution in the crystal grains and its boundaries. Combined with the grain size analysis of Co-rich area by X-ray diffraction peak broaden width, which was not very consistent with the result obtained from other's TEM and AFM studies, Cr diffusion was suggested to be the governing factor at short annealing time region. Co-rich grain growth should also be applied to explain the variation of magnetic properties in longer post annealing.},
keywords={},
doi={},
ISSN={},
month={September},}

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TY - JOUR
TI - Microstructure Analysis of Annealing Effect on CoCrPt Thin Film Media by XRD
T2 - IEICE TRANSACTIONS on Electronics
SP - 1473
EP - 1477
AU - Ding JIN
AU - Ying SU
AU - Jian Ping WANG
AU - Hao GONG
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2000
AB - Post annealing treatment for CoCrPt magnetic thin films were tried in different thermal conditions, by changing the time of annealing procedure. Coercivity (H_c) improvement was achieved in annealed sample compared with those as deposited, in which as high as 5.2 kOe has been attained. To clarify the mechanism of annealing treatment on the magnetic properties, X-ray diffraction (XRD) spectrums of those samples and their magnetic properties were carefully studied. Co and Cr lattice parameters were separately calculated from different crystal lattice plane. It was found that a axis lattice spacing of Co hexagonal structure increases monotonically with increased annealing time. Variation of Co hcp peaks significance may due to Cr or Pt redistribution in the crystal grains and its boundaries. Combined with the grain size analysis of Co-rich area by X-ray diffraction peak broaden width, which was not very consistent with the result obtained from other's TEM and AFM studies, Cr diffusion was suggested to be the governing factor at short annealing time region. Co-rich grain growth should also be applied to explain the variation of magnetic properties in longer post annealing.
ER -