Write Linear Density Limit in Longitudinal Thin Film Media

Jian LI; Xiaobing LIANG; Dan WEI

Write Linear Density Limit in Longitudinal Thin Film Media

Jian LI, Xiaobing LIANG, Dan WEI

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Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.

Publication: IEICE TRANSACTIONS on Electronics Vol.E85-C No.10 pp.1761-1765

Publication Date: 2002/10/01

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Type of Manuscript: Special Section PAPER (Special Issue on Recent Progress in Information Storage Technology)

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Jian LI, Xiaobing LIANG, Dan WEI, "Write Linear Density Limit in Longitudinal Thin Film Media" in IEICE TRANSACTIONS on Electronics, vol. E85-C, no. 10, pp. 1761-1765, October 2002, doi: .
Abstract: Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e85-c_10_1761/_p

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@ARTICLE{e85-c_10_1761,
author={Jian LI, Xiaobing LIANG, Dan WEI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Write Linear Density Limit in Longitudinal Thin Film Media},
year={2002},
volume={E85-C},
number={10},
pages={1761-1765},
abstract={Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.},
keywords={},
doi={},
ISSN={},
month={October},}

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TY - JOUR
TI - Write Linear Density Limit in Longitudinal Thin Film Media
T2 - IEICE TRANSACTIONS on Electronics
SP - 1761
EP - 1765
AU - Jian LI
AU - Xiaobing LIANG
AU - Dan WEI
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E85-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 2002
AB - Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.
ER -