Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages

Makoto HASEGAWA; Jiro MAKIMOTO; Koichiro SAWA

Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages

Makoto HASEGAWA, Jiro MAKIMOTO, Koichiro SAWA

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The authors have been interested in a Scanning Laser Microscope (SLM) and applied it to studies of contact phenomena. In particular, a digital SLM is being currently used, and confirmed to be a successful tool for investigating the contact phenomena. In this paper, the theory and mechanism of a digital SLM are briefly explained, and some actual data obtained with the digital SLM are presented for demonstrating its usefulness for studies of contact phenomena.

Publication: IEICE TRANSACTIONS on Electronics Vol.E86-C No.6 pp.932-938

Publication Date: 2003/06/01

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Type of Manuscript: Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))

Category: Discharges & Related Phenomena

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Makoto HASEGAWA, Jiro MAKIMOTO, Koichiro SAWA, "Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages" in IEICE TRANSACTIONS on Electronics, vol. E86-C, no. 6, pp. 932-938, June 2003, doi: .
Abstract: The authors have been interested in a Scanning Laser Microscope (SLM) and applied it to studies of contact phenomena. In particular, a digital SLM is being currently used, and confirmed to be a successful tool for investigating the contact phenomena. In this paper, the theory and mechanism of a digital SLM are briefly explained, and some actual data obtained with the digital SLM are presented for demonstrating its usefulness for studies of contact phenomena.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e86-c_6_932/_p

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@ARTICLE{e86-c_6_932,
author={Makoto HASEGAWA, Jiro MAKIMOTO, Koichiro SAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages},
year={2003},
volume={E86-C},
number={6},
pages={932-938},
abstract={The authors have been interested in a Scanning Laser Microscope (SLM) and applied it to studies of contact phenomena. In particular, a digital SLM is being currently used, and confirmed to be a successful tool for investigating the contact phenomena. In this paper, the theory and mechanism of a digital SLM are briefly explained, and some actual data obtained with the digital SLM are presented for demonstrating its usefulness for studies of contact phenomena.},
keywords={},
doi={},
ISSN={},
month={June},}

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TY - JOUR
TI - Application of a Digital Scanning Laser Microscope to 3-D Analysis of Contact Surface Damages
T2 - IEICE TRANSACTIONS on Electronics
SP - 932
EP - 938
AU - Makoto HASEGAWA
AU - Jiro MAKIMOTO
AU - Koichiro SAWA
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E86-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2003
AB - The authors have been interested in a Scanning Laser Microscope (SLM) and applied it to studies of contact phenomena. In particular, a digital SLM is being currently used, and confirmed to be a successful tool for investigating the contact phenomena. In this paper, the theory and mechanism of a digital SLM are briefly explained, and some actual data obtained with the digital SLM are presented for demonstrating its usefulness for studies of contact phenomena.
ER -