IEICE TRANSACTIONS on Electronics
Analysis of Connector Contact Failure
Summary :
Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E86-C No.6 pp.945-952
- Publication Date
- 2003/06/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
- Category
- Devices
Authors
Keyword
Latest Issue
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Ji-Gao ZHANG, Jin-Chun GAO, Xue-Yan LIN, "Analysis of Connector Contact Failure" in IEICE TRANSACTIONS on Electronics,
vol. E86-C, no. 6, pp. 945-952, June 2003, doi: .
Abstract: Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e86-c_6_945/_p
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@ARTICLE{e86-c_6_945,
author={Ji-Gao ZHANG, Jin-Chun GAO, Xue-Yan LIN, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis of Connector Contact Failure},
year={2003},
volume={E86-C},
number={6},
pages={945-952},
abstract={Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.},
keywords={},
doi={},
ISSN={},
month={June},}
Copy
TY - JOUR
TI - Analysis of Connector Contact Failure
T2 - IEICE TRANSACTIONS on Electronics
SP - 945
EP - 952
AU - Ji-Gao ZHANG
AU - Jin-Chun GAO
AU - Xue-Yan LIN
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E86-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2003
AB - Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.
ER -
English
