Analysis Method and Simulation Tool for Multilayer MMIC Elements
Summary :
An analysis method based on the FD-TD and radiation mode expansion methods and its simulation tool are developed for calculating circuit characteristics and parameter values of passive MMIC (Monolithic Microwave Integrated Circuits) elements having multilayer structure. For straight multilayer microstrip lines and coplanar waveguides, it is possible to calculate characteristic impedance, effective permittivity, transverse field distribution of guided modes, etc. For various multilayer microstrip and coplanar waveguide elements, it is possible to calculate scattering parameters, radiated power, radiation patterns, etc. As an example of application of the present technique, effects of inclusion of lower permittivity layer in the substrate on transmission and radiation characteristics are investigated for right-angled microstrip bends.
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- IEICE TRANSACTIONS on Electronics Vol.E86-C No.8 pp.1480-1485
- Publication Date
- 2003/08/01
- Publicized
- Online ISSN
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- Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
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Nagayoshi MORITA, Katsuhito OHNO, Hiroyuki FUKUSHIMA, "Analysis Method and Simulation Tool for Multilayer MMIC Elements" in IEICE TRANSACTIONS on Electronics,
vol. E86-C, no. 8, pp. 1480-1485, August 2003, doi: .
Abstract: An analysis method based on the FD-TD and radiation mode expansion methods and its simulation tool are developed for calculating circuit characteristics and parameter values of passive MMIC (Monolithic Microwave Integrated Circuits) elements having multilayer structure. For straight multilayer microstrip lines and coplanar waveguides, it is possible to calculate characteristic impedance, effective permittivity, transverse field distribution of guided modes, etc. For various multilayer microstrip and coplanar waveguide elements, it is possible to calculate scattering parameters, radiated power, radiation patterns, etc. As an example of application of the present technique, effects of inclusion of lower permittivity layer in the substrate on transmission and radiation characteristics are investigated for right-angled microstrip bends.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e86-c_8_1480/_p
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@ARTICLE{e86-c_8_1480,
author={Nagayoshi MORITA, Katsuhito OHNO, Hiroyuki FUKUSHIMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis Method and Simulation Tool for Multilayer MMIC Elements},
year={2003},
volume={E86-C},
number={8},
pages={1480-1485},
abstract={An analysis method based on the FD-TD and radiation mode expansion methods and its simulation tool are developed for calculating circuit characteristics and parameter values of passive MMIC (Monolithic Microwave Integrated Circuits) elements having multilayer structure. For straight multilayer microstrip lines and coplanar waveguides, it is possible to calculate characteristic impedance, effective permittivity, transverse field distribution of guided modes, etc. For various multilayer microstrip and coplanar waveguide elements, it is possible to calculate scattering parameters, radiated power, radiation patterns, etc. As an example of application of the present technique, effects of inclusion of lower permittivity layer in the substrate on transmission and radiation characteristics are investigated for right-angled microstrip bends.},
keywords={},
doi={},
ISSN={},
month={August},}
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TY - JOUR
TI - Analysis Method and Simulation Tool for Multilayer MMIC Elements
T2 - IEICE TRANSACTIONS on Electronics
SP - 1480
EP - 1485
AU - Nagayoshi MORITA
AU - Katsuhito OHNO
AU - Hiroyuki FUKUSHIMA
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E86-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2003
AB - An analysis method based on the FD-TD and radiation mode expansion methods and its simulation tool are developed for calculating circuit characteristics and parameter values of passive MMIC (Monolithic Microwave Integrated Circuits) elements having multilayer structure. For straight multilayer microstrip lines and coplanar waveguides, it is possible to calculate characteristic impedance, effective permittivity, transverse field distribution of guided modes, etc. For various multilayer microstrip and coplanar waveguide elements, it is possible to calculate scattering parameters, radiated power, radiation patterns, etc. As an example of application of the present technique, effects of inclusion of lower permittivity layer in the substrate on transmission and radiation characteristics are investigated for right-angled microstrip bends.
ER -
English
