We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
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Ben C. BUCHLER, Patrick KRAMPER, Maria KAFESAKI, Costas M. SOUKOULIS, Vahid SANDOGHDAR, "Near-Field Optical Investigations of Photonic Crystal Microresonators" in IEICE TRANSACTIONS on Electronics,
vol. E87-C, no. 3, pp. 371-377, March 2004, doi: .
Abstract: We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e87-c_3_371/_p
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@ARTICLE{e87-c_3_371,
author={Ben C. BUCHLER, Patrick KRAMPER, Maria KAFESAKI, Costas M. SOUKOULIS, Vahid SANDOGHDAR, },
journal={IEICE TRANSACTIONS on Electronics},
title={Near-Field Optical Investigations of Photonic Crystal Microresonators},
year={2004},
volume={E87-C},
number={3},
pages={371-377},
abstract={We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - Near-Field Optical Investigations of Photonic Crystal Microresonators
T2 - IEICE TRANSACTIONS on Electronics
SP - 371
EP - 377
AU - Ben C. BUCHLER
AU - Patrick KRAMPER
AU - Maria KAFESAKI
AU - Costas M. SOUKOULIS
AU - Vahid SANDOGHDAR
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E87-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2004
AB - We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
ER -