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Analysis of Antenna Performance Degradation due to Coupled Electromagnetic Interference from Nearby Circuits

Hosang LEE, Jawad YOUSAF, Kwangho KIM, Seongjin MUN, Chanseok HWANG, Wansoo NAH

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Summary :

This paper analyzes and compares two methods to estimate electromagnetically coupled noises introduced to an antenna due to the nearby circuits at a circuit design stage. One of them is to estimate the power spectrum, and the other one is to estimate the active S11 parameter at the victim antenna, respectively, and both of them use simulated standard S-parameters for the electromagnetic coupling in the circuit. They also need the assumed or measured excitation of noise sources. To confirm the validness of the two methods, an evaluation board consisting of an antenna and noise sources were designed and fabricated in which voltage controlled oscillator (VCO) chips are placed as noise sources. The generated electromagnetic noises are transferred to an antenna via loop-shaped transmission lines, degrading the performance of the antenna. In this paper, detailed analysis procedures are described using the evaluation board, and it is shown that the two methods are equivalent to each other in terms of the induced voltages in the antenna. Finally, a procedure to estimate antenna performance degradation at the design stage is summarized.

Publication
IEICE TRANSACTIONS on Electronics Vol.E103-C No.3 pp.110-118
Publication Date
2020/03/01
Publicized
2019/08/27
Online ISSN
1745-1353
DOI
10.1587/transele.2019ECP5019
Type of Manuscript
PAPER
Category
Electromagnetic Theory

Authors

Hosang LEE
  Sungkyunkwan University
Jawad YOUSAF
  Sungkyunkwan University
Kwangho KIM
  Sungkyunkwan University
Seongjin MUN
  Samsung Electronics Co. Ltd.
Chanseok HWANG
  Samsung Electronics Co. Ltd.
Wansoo NAH
  Sungkyunkwan University

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