Depth profile of mass density of vertical alignment film was investigated by X-ray reflectivity, in order to characterize side chains at film surface for vertical alignment of liquid crystals. Existence thin and low density top layer at surface of polyimide film, which was considered to be side chains, was clearly detected. Furthermore, existence of high density layer just below side chain layer was also found, and it is suggested that backbone chain ordering at film surface. Effect of rubbing on VA film was not detected. However, density growth by annealing just below side chain layer of rubbed VA film suggests more ordered backbone chain alignment induced by rubbing.
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Ichiro HIROSAWA, Tomoyuki KOGANEZAWA, Hidenori ISHII, "Characterization of Vertical Alignment Film by X-Ray Reflectivity" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 11, pp. 1755-1759, November 2011, doi: 10.1587/transele.E94.C.1755.
Abstract: Depth profile of mass density of vertical alignment film was investigated by X-ray reflectivity, in order to characterize side chains at film surface for vertical alignment of liquid crystals. Existence thin and low density top layer at surface of polyimide film, which was considered to be side chains, was clearly detected. Furthermore, existence of high density layer just below side chain layer was also found, and it is suggested that backbone chain ordering at film surface. Effect of rubbing on VA film was not detected. However, density growth by annealing just below side chain layer of rubbed VA film suggests more ordered backbone chain alignment induced by rubbing.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1755/_p
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@ARTICLE{e94-c_11_1755,
author={Ichiro HIROSAWA, Tomoyuki KOGANEZAWA, Hidenori ISHII, },
journal={IEICE TRANSACTIONS on Electronics},
title={Characterization of Vertical Alignment Film by X-Ray Reflectivity},
year={2011},
volume={E94-C},
number={11},
pages={1755-1759},
abstract={Depth profile of mass density of vertical alignment film was investigated by X-ray reflectivity, in order to characterize side chains at film surface for vertical alignment of liquid crystals. Existence thin and low density top layer at surface of polyimide film, which was considered to be side chains, was clearly detected. Furthermore, existence of high density layer just below side chain layer was also found, and it is suggested that backbone chain ordering at film surface. Effect of rubbing on VA film was not detected. However, density growth by annealing just below side chain layer of rubbed VA film suggests more ordered backbone chain alignment induced by rubbing.},
keywords={},
doi={10.1587/transele.E94.C.1755},
ISSN={1745-1353},
month={November},}
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TY - JOUR
TI - Characterization of Vertical Alignment Film by X-Ray Reflectivity
T2 - IEICE TRANSACTIONS on Electronics
SP - 1755
EP - 1759
AU - Ichiro HIROSAWA
AU - Tomoyuki KOGANEZAWA
AU - Hidenori ISHII
PY - 2011
DO - 10.1587/transele.E94.C.1755
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 11
JA - IEICE TRANSACTIONS on Electronics
Y1 - November 2011
AB - Depth profile of mass density of vertical alignment film was investigated by X-ray reflectivity, in order to characterize side chains at film surface for vertical alignment of liquid crystals. Existence thin and low density top layer at surface of polyimide film, which was considered to be side chains, was clearly detected. Furthermore, existence of high density layer just below side chain layer was also found, and it is suggested that backbone chain ordering at film surface. Effect of rubbing on VA film was not detected. However, density growth by annealing just below side chain layer of rubbed VA film suggests more ordered backbone chain alignment induced by rubbing.
ER -